Leica Science Lab - Tag : SEM https://www.leica-microsystems.com//science-lab/tag/sem/ Article tagged with SEM en-US https://www.leica-microsystems.com/29634 EM Sample Preparation CLEM Introduction to Ion Beam Etching with the EM TIC 3X In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the instrument explains how the flexible setup of the EM TIC 3X gives you the opportunity to prepare samples for various investigation areas. https://www.leica-microsystems.com/science-lab/introduction-to-ion-beam-etching-with-the-em-tic-3x/ Mon, 11 May 2020 13:15:00 +0000 Corporate Communications https://www.leica-microsystems.com/26513 Quality Assurance Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in this report. For rapid, confident decisions during steel quality control or failure analysis, having both microstructural and composition data is important. A 2-in-1 solution can reduce the cost and time for accurate steel inclusion analysis. https://www.leica-microsystems.com/science-lab/visual-and-chemical-analysis-of-steel-microstructure-faster-rating-of-steel-quality/ Wed, 06 May 2020 12:38:00 +0000 PhD James DeRose, Dr. Kay Scheffler, PhD Konstantin Kartaschew, Mike Horz, Thomas Locherer https://www.leica-microsystems.com/11641 Surface Metrology Quality Assurance Brief Introduction to Surface Metrology This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With the advent of nanotechnology, thin coatings, and the miniaturization of circuits and devices, surface metrology has become an extremely important field of science and engineering. https://www.leica-microsystems.com/science-lab/brief-introduction-to-surface-metrology/ Wed, 06 Nov 2019 08:27:00 +0000 PhD James DeRose, M.S. Albert S. Laforet, PhD David R. Barbero https://www.leica-microsystems.com/20212 EM Sample Preparation Metallography Quality Assurance Stereo Microscopy 3-Dimensional Imaging of Macroscopic Defects in Aluminum Alloys The investigation of macroscale defects in aluminum (Al) alloys with a rapid 3-dimensional (3D) imaging approach is described in this report. Aluminum (Al) alloys play an important role in the production of aircraft and vehicles, as well as products in other industries. Defects present in the Al alloy used for the production of aircraft, vehicles, or other products can have a significant effect on their quality, performance, and lifetime. https://www.leica-microsystems.com/science-lab/3-dimensional-imaging-of-macroscopic-defects-in-aluminum-alloys/ Thu, 17 Oct 2019 07:00:00 +0000 PhD Wolfgang Grünewald, PhD James DeRose https://www.leica-microsystems.com/26685 EM Sample Preparation Studying the Microstructure of Natural Polymers in Fine Detail The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft polymers is assessed in this report. Results from the examination of delicate, natural polymers, such as tomato skin and wood, with cryo-BIB-SEM are shown. The polymer surface morphology and various microstructural features were analyzed. https://www.leica-microsystems.com/science-lab/studying-the-microstructure-of-natural-polymers-in-fine-detail/ Wed, 16 Oct 2019 10:30:00 +0000 PhD Joyce Schmatz, PhD James DeRose, PhD David R. Barbero, M.Sc. Martin Nopens https://www.leica-microsystems.com/25036 EM Sample Preparation Expert Knowledge on High Pressure Freezing and Freeze Fracturing in the Cryo SEM Workflow Get an insight in the working methods of the laboratory and learn about the advantages of Cryo SEM investigation in EM Sample Preparation. Find out how high pressure freezing, freeze fracturing and cryo transfer add to the Cryo SEM workflow and how the Leica portfolio ensures the compatibility between these different steps. https://www.leica-microsystems.com/science-lab/expert-knowledge-on-high-pressure-freezing-and-freeze-fracturing-in-the-cryo-sem-workflow/ Thu, 23 May 2019 22:00:00 +0000 Gisela Höflinger https://www.leica-microsystems.com/20642 EM Sample Preparation High Resolution Array Tomography with Automated Serial Sectioning The optimization of high resolution, 3-dimensional (3D), sub-cellular structure analysis with array tomography using an automated serial sectioning solution, achieving a high section density on the carrier substrate, is described in this report. https://www.leica-microsystems.com/science-lab/high-resolution-array-tomography-with-automated-serial-sectioning/ Sun, 14 Oct 2018 22:00:00 +0000 Robert Ranner, PhD James DeRose https://www.leica-microsystems.com/20352 EM Sample Preparation Macroscale to Nanoscale Pore Analysis of Shale and Carbonate Rocks Physical porosity in rocks, like shale and carbonate, has a large effect on the their storage capacity. The pore geometries also affect their permeability. Imaging the visible pore space provides insights into the physical pore space, pore geometries, and the associated mineral and organic matter phases relevant for storage and transport. For example, organic-matter porosity is an important property of mature organic-rich shales providing storage capacity for liquids and gases, like hydrocarbons. Imaging the microstructure is the only technique which delivers data giving direct insight into the organic matter porosity. However, imaging porosity in fine-grained shale as well as carbonate rocks in a representative way at high resolution is challenging. https://www.leica-microsystems.com/science-lab/macroscale-to-nanoscale-pore-analysis-of-shale-and-carbonate-rocks/ Tue, 04 Sep 2018 22:00:00 +0000 PhD Jop Klaver, PhD Joyce Schmatz, MSc Mingze Jiang, PhD James DeRose https://www.leica-microsystems.com/18221 EM Sample Preparation Contrast Enhancement of Polycrystalline Metals - Sample Preparation for SEM Application Note - Ion milling is a perfect alternative for chemical etching, especially for polycrystalline metals, such as copper. Ion milling can be used to increase the contrast of the grain structure and their interfaces. In contrast to chemical etching the milling process is clean, safe and easy to operate. Ion energy and milling time depend on the milling rate of the metal. https://www.leica-microsystems.com/science-lab/contrast-enhancement-of-polycrystalline-metals-sample-preparation-for-sem/ Wed, 01 Feb 2017 10:33:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/19176 EM Sample Preparation Drosophila larvae - Sample Preparation for Cryo-SEM Application Note for Leica EM ACE900 - Drosophila larvae were sandwiched between two 3 mm aluminum slit carriers with the 100 μm cavities facing each other and high-pressure frozen with a Leica EM HPM100. No ethanol as synchronization media was used, 1-hexadecene was used as filler. The wholes of the slit carriers were filled with filter tips dipped in 1-hexadecene to keep the carrier sandwich complete after freezing. https://www.leica-microsystems.com/science-lab/drosophila-larvae-sample-preparation-for-cryo-sem/ Mon, 30 Jan 2017 09:50:00 +0000 Dr. Andres Kaech, Prof. Damian Brunner https://www.leica-microsystems.com/18247 EM Sample Preparation Porous Ceramics - Sample Preparation for SEM Application Note for Leica EM RES102 - Ceramic membrane filters with pore sizes down to a few nanometres must be investigated in cross-section with regard to the structure of the pores. The smallest pores are of special interest. In most cases, conventional grinding methods cannot be used for such problems, as the pore structure would be distorted. This applies in particular to the pores in the nanometre range. https://www.leica-microsystems.com/science-lab/porous-ceramics-sample-preparation-for-sem/ Tue, 17 Jan 2017 07:32:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18249 EM Sample Preparation Removal of Surface Layers - Sample Preparation for SEM and TEM Application Note for Leica EM RES102 - Sometimes it is necessary to remove surface layers to gain access to the real surface structure. That can be a native oxide, or layers coming from the preparation process itself, like re-deposition. Depending on the layers thickness and the energy used for the cleaning process, it takes between a few seconds and half an hour. The energy depends on the milling rate of the material. https://www.leica-microsystems.com/science-lab/removal-of-surface-layers-sample-preparation-for-sem-and-tem/ Wed, 11 Jan 2017 10:10:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18362 EM Sample Preparation Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping, defect studies, phase identification, grain boundary studies and morphology studies. The information depth is just a few nm. Therefore good sample preparation is very important to avoid any damage. This is very difficult in case of multilayer system with big differences in hardness. https://www.leica-microsystems.com/science-lab/cross-sectioning-of-a-multilayer-system-preparation-of-a-perfect-sample-surface-for-ebsd/ Thu, 22 Dec 2016 20:48:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18110 EM Sample Preparation Tobacco Leaf - Critical Point Drying Protocol for SEM Application Note for Leica EM CPD300 - Critical point drying of tobacco leafs with subsequent platinum coating and SEM analysis. https://www.leica-microsystems.com/science-lab/tobacco-leaf-critical-point-drying-protocol-for-sem/ Fri, 18 Nov 2016 16:21:00 +0000 Dr. Martin W. Goldberg, M.Sc. Christine Richardson https://www.leica-microsystems.com/18245 EM Sample Preparation Paper Samples - Sample Preparation for SEM Application Note for Leica EM RES102 - A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard to its applicability. With the use of ion beam slope cutting a cross section of paper could be prepared. On the basis of this sample processing, it was possible to show the largely unaffected original structure of the thermally-sensitive paper in the scanning electron microscope. https://www.leica-microsystems.com/science-lab/paper-samples-sample-preparation-for-sem/ Wed, 16 Nov 2016 14:01:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18106 EM Sample Preparation Nematode E. dianae - Critical Point Drying Protocol for SEM Application Note for Leica EM CPD300 - Critical point drying of nematode Eubostrichus dianae to detect the ectosymbiotic bacteria layer with subsequent gold coating ans SEM analysis. https://www.leica-microsystems.com/science-lab/nematode-e-dianae-critical-point-drying-protocol-for-sem/ Wed, 16 Nov 2016 11:05:00 +0000 Mag. Nikolaus Leisch https://www.leica-microsystems.com/18235 EM Sample Preparation Contrast Enhancement of Polished Cross Sections of Semiconductor Structures - Sample Preparation for SEM Application Note for Leica EM RES102 - The surfaces of polished cross sections often show fine scratches and residues of the removed material or of the abrasive material. The artefacts are strongly material-dependent, and are mostly only detectable at higher resolutions in the scanning electron microscope. A further problem arises from the fact that the ground section mostly only has low contrast, i.e., in the structures of the semiconductor materials are very difficult to discern. With the use of ion beam milling, the ground sections of semiconductor structures can be "contrasted". https://www.leica-microsystems.com/science-lab/contrast-enhancement-of-polished-cross-sections-of-semiconductor-structures-sample-preparation-for-sem/ Fri, 28 Oct 2016 12:08:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18142 EM Sample Preparation Wall Cress Pod Protocol - Critical Point Drying of Arabidopsis thaliana for SEM Application Note for Leica EM CPD300 - Critical point drying of wall cress (Arabidopsis thaliana) pod with subsequent gold coating and SEM analysis. https://www.leica-microsystems.com/science-lab/wall-cress-pod-protocol-critical-point-drying-of-arabidopsis-thaliana-for-sem/ Tue, 25 Oct 2016 08:00:00 +0000 Dr. Chen LiYu https://www.leica-microsystems.com/18257 EM Sample Preparation Surface Modification of ZnAg Sample - Sample Preparation for SEM Application Note for Leica EM RES102 - By means of cleaning, polishing and contrast enhancement a soft ZnAg sample should be prepared to obtain information concerning the grain structure and interfaces of the sample. The sample is contaminated after mechanical polishing. There are still some scratches on the surface. Grain structure is almost invisible. https://www.leica-microsystems.com/science-lab/surface-modification-of-znag-sample-sample-preparation-for-sem/ Mon, 17 Oct 2016 08:16:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18364 EM Sample Preparation Cross Sectioning of Ni/Cu on Steel for EBSD Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping, defect studies, phase identification, grain boundary studies and morphology studies. The information depth is just a few nm. Therefore a good sample preparation is very important. https://www.leica-microsystems.com/science-lab/cross-sectioning-of-nicu-on-steel-for-ebsd/ Fri, 14 Oct 2016 09:45:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18096 EM Sample Preparation Bacteria Protocol - Critical Point Drying of E. coli for SEM Application Note for Leica EM CPD300 - Critical point drying of E. coli with subsequent platinum / palladium coating and SEM analysis. Sample was inserted into a filter disc (Pore size: 16 - 40 μm) and placed into the filter discs and porous pots holder. Cultivate fungi and bacteria on agar containing growth medium for 3 days. https://www.leica-microsystems.com/science-lab/bacteria-protocol-critical-point-drying-of-e-coli-for-sem/ Thu, 13 Oct 2016 10:04:00 +0000 Dr. W. H. Mueller https://www.leica-microsystems.com/18104 EM Sample Preparation Clawed Frog Nuclear Envelope Protocol Application Note for Leica EM CPD300 - Critical point drying of nuclear pores from clawed frog oocytes with subsequent chromium coating and SEM analysis. Silicon chips containing the samples were placed into the filter discs and porous pots holder. https://www.leica-microsystems.com/science-lab/clawed-frog-nuclear-envelope-protocol/ Thu, 06 Oct 2016 16:00:00 +0000 Dr. Martin W. Goldberg, M.Sc. Christine Richardson https://www.leica-microsystems.com/18259 EM Sample Preparation Thin Metal Foils with Coatings - Sample Preparation for SEM Application Note for Leica EM RES102 - Thin foils are mostly unstable because of their thickness of a few microns. This makes it difficult to do slope cutting without any protection of the sample. A common realisation to protect the sample surface is by sticking a cover glass on top of the sample. Another issue is cutting the foils before ion milling. The sample edge should be flat and sharp without any broken areas. A razor blade is mostly the best solution. A protected sample can salso be sawed with a wire saw. https://www.leica-microsystems.com/science-lab/thin-metal-foils-with-coatings-sample-preparation-for-sem/ Wed, 05 Oct 2016 07:16:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18239 EM Sample Preparation Ion Beam Polishing of Sample Surfaces - Sample Preparation for SEM Application Note for Leica EM RES102 - Ion milling can be used to reduce the roughness of sample surfaces. Small angles less than 6° with respect to the sample surface are necessary. The high voltage depends on the material to be prepared. The reason for the levelling effect is the different milling angle of flat and rough surface areas. The milling rate is lower for small angles. The rough surface area will be faster milled. Ion polishing is often the final step of sample preparation. The prerequisite is a perfect mechanical prepreparation as samples with deep surface scratches cannot be ion polished. Soft materials usually have a smeared sample surface after mechanical polishing. It is necessary to remove this smeared material before ion polishing. Otherwise the above mentioned polishing effect does not work. https://www.leica-microsystems.com/science-lab/ion-beam-polishing-of-sample-surfaces-sample-preparation-for-sem/ Tue, 06 Sep 2016 11:11:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18144 EM Sample Preparation Wrinkled Giant Hyssop Leaf Protocol Application Note for Leica EM CPD300 - Critical point drying of wrinkled giant hyssop leaf with subsequent gold coating and SEM analysis. https://www.leica-microsystems.com/science-lab/wrinkled-giant-hyssop-leaf-protocol/ Thu, 11 Aug 2016 17:04:00 +0000 Dr. Guo JianSheng https://www.leica-microsystems.com/18100 EM Sample Preparation Black Mould Protocol Application Note for Leica EM CPD300 - Critical point drying of Black mould (Aspergilus niger) with subsequent platinum / palladium coating and SEM analysis to detect conidiospores. Sample was inserted into a filter disc (Pore size: 16 - 40 μm) and placed into the filter discs and porous pots holder. https://www.leica-microsystems.com/science-lab/black-mould-protocol/ Tue, 09 Aug 2016 12:01:00 +0000 Dr. W. H. Mueller https://www.leica-microsystems.com/18368 EM Sample Preparation Cross Sectioning of Oil Shale Rock Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently 2μm and finally 0.5μm grain size were used. It took about 1.5 hours. The sample was removed from the stub with a razor blade after TXP processing and fixed onto the holder of the rotary stage of the Leica EM TIC 3X. https://www.leica-microsystems.com/science-lab/cross-sectioning-of-oil-shale-rock/ Tue, 28 Jun 2016 13:04:00 +0000 Robert Ranner https://www.leica-microsystems.com/18284 EM Sample Preparation Cryo-SEM Imaging of Latex Paint Application Note for Leica EM VCT100, Leica EM ACE600 - A thin layer of latex paint was spread on a clean, scored, silicon chip. The sample was immediately plunge frozen in liquid ethane and transferred under LN2 to the Leica EM VCT100 loading station where it was placed in the customized sample holder. https://www.leica-microsystems.com/science-lab/cryo-sem-imaging-of-latex-paint/ Thu, 16 Jun 2016 16:50:00 +0000 Dr. Levi Felts, Dr. Kim Rensing, Chris Frethem https://www.leica-microsystems.com/18184 EM Sample Preparation Cross Sectioning of Rubber (Tire) Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components. https://www.leica-microsystems.com/science-lab/cross-sectioning-of-rubber-tire/ Tue, 14 Jun 2016 10:30:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/18086 EM Sample Preparation Water Flea Protocol Application Note for Leica EM CPD300 - Critical point drying of water flea with subsequent gold coating and SEM-Analysis to detect finde surface structures. https://www.leica-microsystems.com/science-lab/water-flea-protocol/ Tue, 07 Jun 2016 07:06:00 +0000 Mag. Dr. Daniela Gruber https://www.leica-microsystems.com/18079 EM Sample Preparation Human Blood Cells Protocol Application Note for Leica EM CPD300 - Life Science Research. Species: Human (Homo sapiens) Critical point drying of human blood with subsequent platinum / palladium coating and SEM analysis. https://www.leica-microsystems.com/science-lab/human-blood-cells-protocol/ Tue, 24 May 2016 08:03:00 +0000 Dr. W. H. Mueller https://www.leica-microsystems.com/17645 EM Sample Preparation Improvement of Metallic Thin Films for HR-SEM by Using DC Magnetron Sputter Coater Preparation techniques, like several kinds of coating methods play an important role for high resolution scanning electron microscopy (HR-SEM). Nonconductive sample like biological and synthetic samples have to be prepared with a thin conductive layer to prevent charging. https://www.leica-microsystems.com/science-lab/improvement-of-metallic-thin-films-for-hr-sem-by-using-dc-magnetron-sputter-coater/ Wed, 13 Apr 2016 08:30:00 +0000 Dr. Johannes Rattenberger, DI Alexander Melischnig, DI Dr. Ilse Letofsky-Papst, DI Thomas Ganner, Ing. Hartmuth Schröttner https://www.leica-microsystems.com/17377 EM Sample Preparation Triple-beam Ar-Ion-Milling with a Rotary Stage to Decorate Grain Boundaries and Substructures in Rock Salt Decoration of grain boundaries in polycrystalline rocks has a long tradition in Structural Geology as in a monomineralic rock the recrystallized grain size is a good indicator for the paleostress conditions. Understanding the mechanical properties of rock salt and its deformation behavior is of major importance for the prediction of long-term stability of nuclear waste repositories, and our understanding of the dynamics of salt-related sedimentary basins which host the majority of oil and gas accumulations on Earth. https://www.leica-microsystems.com/science-lab/triple-beam-ar-ion-milling-with-a-rotary-stage-to-decorate-grain-boundaries-and-substructures-in-rock-salt/ Thu, 03 Mar 2016 11:01:00 +0000 PhD Joyce Schmatz, PhD Oliver Schenk, PhD Jop Klaver, PhD Janos Urai, PhD Wolfgang Grünewald https://www.leica-microsystems.com/15930 EM Sample Preparation High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the specimen surface should be exempt of any damages in order to produce EBSD patterns. Here, we present a successful and efficient EBSD sample polishing of two very challenging specimens prepared by broad ion beam milling. https://www.leica-microsystems.com/science-lab/high-quality-sample-preparation-for-ebsd-analysis-by-broad-ion-beam-milling/ Fri, 12 Jun 2015 20:30:00 +0000 PhD Laurie Palasse, PhD Wolfgang Grünewald https://www.leica-microsystems.com/14828 Confocal Microscopy Laser Microdissection CLEM Live-Cell Imaging Customized Patterned Substrates for Highly Versatile Correlative Light-Scanning Electron Microscopy Correlative light electron microscopy (CLEM) combines the advantages of light and electron microscopy, thus making it possible to follow dynamic events in living cells at nanometre resolution. Various CLEM approaches and devices have been developed, each of which has its own advantages and technical challenges. We here describe our customized patterned glass substrates, which improve the feasibility of correlative fluorescence/confocal and scanning electron microscopy. https://www.leica-microsystems.com/science-lab/customized-patterned-substrates-for-highly-versatile-correlative-light-scanning-electron-microscopy/ Fri, 06 Mar 2015 17:14:00 +0000 https://www.leica-microsystems.com/14406 EM Sample Preparation Brief Introduction to Freeze Fracture and Etching Freeze fracture describes the technique of breaking a frozen specimen to reveal internal structures. Freeze etching is the sublimation of surface ice under vacuum to reveal details of the fractured face that were originally hidden. A metal/carbon mix enables the sample to be imaged in a SEM (block-face) or TEM (replica). It is used to investigate for instance cell organelles, membranes, layers and emulsions. https://www.leica-microsystems.com/science-lab/brief-introduction-to-freeze-fracture-and-etching/ Wed, 01 Oct 2014 09:27:00 +0000 Gisela Höflinger https://www.leica-microsystems.com/13800 EM Sample Preparation Analysis of Oil Shale as an Alternative Source of Energy For some years now, the search for alternative sources of raw materials has concentrated on oil shale deposits. As the exploitation of these raw materials is still extremely complex and expensive, analysis of oil shale samples is therefore extremely important for identifying the deposit’s potential in advance and optimizing mining methods. https://www.leica-microsystems.com/science-lab/analysis-of-oil-shale-as-an-alternative-source-of-energy/ Tue, 24 Jun 2014 08:23:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/10222 EM Sample Preparation Brief Introduction to Coating Technology for Electron Microscopy Coating of samples is required in the field of electron microscopy to enable or improve the imaging of samples. Creating a conductive layer of metal on the sample inhibits charging, reduces thermal damage and improves the secondary electron signal required for topographic examination in the SEM. https://www.leica-microsystems.com/science-lab/brief-introduction-to-coating-technology-for-electron-microscopy/ Wed, 28 Aug 2013 12:10:00 +0000 Gisela Höflinger https://www.leica-microsystems.com/5726 EM Sample Preparation A Word on Cathodoluminescence Cathodoluminescence microanalysis is an emerging technique that is fast gaining popularity in the world of materials science. CL is a light emission phenomena resulting from the electron beam excitation of a luminescent material. https://www.leica-microsystems.com/science-lab/a-word-on-cathodoluminescence/ Sun, 03 Feb 2013 23:00:00 +0000 Cathy Johnson https://www.leica-microsystems.com/5734 EM Sample Preparation University of Wollongong Electron Microscopy Centre The University of Wollongong has a diverse range of materials research programs that includes metallurgy for mining, manufacturing, steel making and transport; polymers for solar cells, energy storage and bionic implants; and superconducting and electronic materials for commercialization, energy storage, telecommunications and medical applications. Electron microscopy is an integral part of this research, due to the chemical and structural information that can be provided down to the atomic scale. https://www.leica-microsystems.com/science-lab/university-of-wollongong-electron-microscopy-centre/ Thu, 17 Jan 2013 23:00:00 +0000 Darren Attard, Tony Romeo https://www.leica-microsystems.com/7972 EM Sample Preparation Brief Introduction to Critical Point Drying One of the uses of the Scanning Electron Microscope (SEM) is in the study of surface morphology in biological applications which requires the preservation of the surface details of a specimen. Samples for Electron Microscopy (EM) imaging need to be dried in order to be compatible with the vacuum in the microscope. The presence of water molecules will disturb the vacuum and with it the imaging. https://www.leica-microsystems.com/science-lab/brief-introduction-to-critical-point-drying/ Mon, 10 Dec 2012 23:00:00 +0000 Dr. Ruwin Pandithage https://www.leica-microsystems.com/11027 EM Sample Preparation Neuroscience Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue This protocol describes how biological samples, like brain tissue, can be imaged in three dimensions using the focussed ion beam/scanning electron microscope (FIB/SEM). The samples are fixed with aldehydes, heavy metal stained using osmium tetroxide and uranyl acetate. They are then dehydrated with alcohol and infiltrated with resin, which is then hardened. https://www.leica-microsystems.com/science-lab/focussed-ion-beam-milling-and-scanning-electron-microscopy-of-brain-tissue/ Wed, 06 Jul 2011 16:17:00 +0000