Leica Science Lab - Tag : Staining https://www.leica-microsystems.com//science-lab/tag/?tx_leicaacademy_pi4%5Baction%5D=show&tx_leicaacademy_pi4%5Bcontroller%5D=Tag&tx_leicaacademy_pi4%5Btag%5D=608&cHash=14e65bbbeba6fa74bc23446cb3b40c9e Article tagged with Staining en-US https://www.leica-microsystems.com/10912 EM Sample Preparation Brief Introduction to Contrasting for EM Sample Preparation Since the contrast in the electron microscope depends primarily on the differences in the electron density of the organic molecules in the cell, the efficiency of a stain is determined by the atomic weight of the stain attached to the biological structures. Consequently, the most widely used stains in electron microscopy are the heavy metals uranium and lead. https://www.leica-microsystems.com/science-lab/brief-introduction-to-contrasting-for-em-sample-preparation/ Wed, 02 Oct 2013 14:33:00 +0000 Dr. Ruwin Pandithage https://www.leica-microsystems.com/10290 Super-Resolution Live-Cell Imaging Neuroscience New Labeling Tools Can Help to Realize the Full Potential of Super-Resolution Microscopy Since super-resolution microscopy techniques revolutionized the concept of light microscopy by overcoming the physical diffraction limit, STED microscopy and other super-resolution techniques have aroused considerable interest. The diffraction limit imposes no more constraints on resolution. New microscopes with ever-decreasing resolution limits are being developed, for instance by the inventor of STED microscopy, Prof. Stefan Hell, now director at the Max Planck Institute for Biophysical Chemistry in Göttingen, Germany. https://www.leica-microsystems.com/science-lab/new-labeling-tools-can-help-to-realize-the-full-potential-of-super-resolution-microscopy/ Fri, 02 Aug 2013 10:55:00 +0000 Dr. Matthias Schauen, Dr. Felipe Opazo, Prof. Silvio Rizzoli https://www.leica-microsystems.com/7405 EM Sample Preparation Perusing Alternatives for Automated Staining of TEM Thin Sections Contrast in transmission electron microscopy (TEM) is mainly produced by electron scattering at the specimen: Structures that strongly scatter electrons are referred to as electron dense and appear as dark areas in the bright fi eld image, while structures which scatter fewer electrons appear bright (electron transparent). https://www.leica-microsystems.com/science-lab/perusing-alternatives-for-automated-staining-of-tem-thin-sections/ Mon, 04 Feb 2013 23:00:00 +0000 Nicole Fellner, Marlene Brandstetter, Karin Trimmel, Dr. Guenter Resch