Leica Science Lab - Tag : Metrology https://www.leica-microsystems.com//science-lab/tag/?tx_leicaacademy_pi4%5Baction%5D=show&tx_leicaacademy_pi4%5Bcontroller%5D=Tag&tx_leicaacademy_pi4%5Btag%5D=687&cHash=0dd3ee0b40b3281a8f55e3e5bd6ff057 Article tagged with Metrology en-US https://www.leica-microsystems.com/11641 Surface Metrology Quality Assurance Brief Introduction to Surface Metrology This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With the advent of nanotechnology, thin coatings, and the miniaturization of circuits and devices, surface metrology has become an extremely important field of science and engineering. https://www.leica-microsystems.com/science-lab/brief-introduction-to-surface-metrology/ Wed, 06 Nov 2019 08:27:00 +0000 PhD James DeRose, M.S. Albert S. Laforet, PhD David R. Barbero