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  • Inspection of Multilayer Coating in the Automotive Industry

    Today’s automotive industry use a variety of decorative and functional treatment to improve the vehicles surfaces. Traditional quality control methods to inspect these multilayer samples have proven to be extremely time-consuming and bear the risk of missing defects. A new approach combining a target surface system and a light microscope offers new possibilities of speed and reliability. F. Javier Ruiz Balbas, Laboratory Manager at Atotech Spain, explains his experiences with the system.
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  • Automotive Industry: How Suppliers and Auto Manufacturers Can Verify Parts Specifications Quickly and Easily

    Checking specifications is critical: During the manufacture of auto parts, specifications must be met – whether by the auto parts supplier or the automobile manufacturer. It is important that the parts meet specifications as they are critical for maintaining the performance standards and safe operation of automobiles, trucks, and other vehicles during their lifetimes.
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  • Webinar: Sample Preparation of Nanocomposites and Nanomaterials by Ultramicrotomy - a Powerful Alternative to FIB

    In this webinar the sample preparation workflow including the Ultramicrotome Leica EM UC7, its cryo-chamber Leica EM FC7 and the pre-preparation system Leica EM TXP will be given. The main part of this webinar will cover tips and tricks to reveal the internal structure of composites and materials being investigated with TEM and STEM. Differences between Focused Ion Beam (FIB) and Ultramicrotomed samples will be shown and explained.
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  • Automotive Industry: Rapid and Precise Surface Inspection on Hard-to-Image Samples

    In the automotive industry, microscopists may be challenged with samples that are difficult to image, for example, parts that have a special material composition. This report shows how the Leica DVM6 digital microscope helps to make inspection, measurement analysis, and reporting of such challenging samples quicker and easier.
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  • TEM Sample Preparation Made Easy - Prepare TEM Specimen by Broad Beam Argon Ion Milling

    Quantitative and analytical analysis at high spatial resolution places stringent demands on the quality of the produced TEM specimens. Pristine and high-quality samples are indispensible for atomic resolution TEM analysis. In this application note a general procedure for obtaining cross-sectional and plan-view TEM specimens using the Leica EM RES102 ion milling system is outlined. The procedure described below can be easily adapted for a large range of materials e.g. thin film materials, semiconductors, multilayered materials, ceramics, superconductors, …
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  • Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica Reference Site in Antwerp. This site, officially opened in July 2014, is dedicated to specimen preparation for electron microscopy in materials science with a special focus on ion beam milling and recently also on carbon coating. In this interview Prof Gustaf van Tendeloo, Director of EMAT, and Frédéric Leroux, TEM specimen preparation specialist, talk about research topics at EMAT, how the Leica reference site has evolved, and future trends for EM sample preparation.
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  • Microscopes Put to the Test with Severe Conditions: ISO Standard for Resistance of Optical Instruments to Fungus and Mold Growth

    Microscopes and other optical instruments can be affected during use by environmental factors. The environment depends on the geographic location and conditions of the place where the instrument is put to use. Usually, microscopes are manufactured in a way to ensure instrument robustness to a variety of conditions.
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  • High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling

    Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the specimen surface should be exempt of any damages in order to produce EBSD patterns. Here, we present a successful and efficient EBSD sample polishing of two very challenging specimens prepared by broad ion beam milling.
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  • Webinar: Innovative Sample Preparation Method of Heterogeneous Materials for EM Observation

    Sample Preparation is a prerequisite for microscopy. It’s essential for achieving accurate and reproducible results. To get the best results in interfacial characterization, Leica Microsystems developed a triple ion beam cutting technique for electron microscopy observation. This technique is integrated into the ion beam slope cutter Leica EM TIC 3X and optimizes the processing conditions of sample preparation to reveal the nano-sized interfacial features of the specimen.
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  • Automated Digital 3D Topography Measurement with the Leica DCM 3D Dual Core Measuring Microscope

    The precise measurement of surface structures and topography is the key thing during the production, control and development in many sectors of industry or research. Because very often there is not possible to use some contact methods for performing this task new optical methods based on interferometry and confocal technology started to be available for non-contact surface metrology in the recent years.
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  • Restoration in an Open Workshop

    For more than a year from August 2007 through October 2008 museum visitors of the Statens Museum for Kunst, the Danish National Gallery in Copenhagen, were able to experience an open conservation studio in the exhibition area. The reason for bringing the conservators and all their equipment into the exhibition rooms of the museum was the conservation, restoration and technical research of Jacob Jordaens’ (1593 – 1678) early masterpiece “The Tribute Money. Peter Finding the Silver Coin in the Mouth of the Fish”, also known as “The Ferry Boat to Antwerp”.
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