In this webinar the sample preparation workflow including the Ultramicrotome Leica EM
UC7, its cryo-chamber Leica EM
FC7 and the pre-preparation system Leica EM
TXP will be given. The main part of this webinar will cover tips and tricks to reveal the internal structure of composites and materials being investigated with TEM
and STEM. Differences between Focused Ion Beam (FIB
) and Ultramicrotomed samples will be shown and explained.