Leica Science Lab - Tag : Cleanliness Analysis https://www.leica-microsystems.com//science-lab/tag/tags/cleanliness-analysis/show/Tag/ Article tagged with Cleanliness Analysis en-US https://www.leica-microsystems.com/19763 Metallography Quality Assurance Forensics See the Structure with Microscopy - Know the Composition with Laser Spectroscopy The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in this report. The basic principles of the 2-in-1 solution and a comparison between it and other common materials analysis methods, such scanning electron microscopy (SEM), are explained to demonstrate how a rapid, efficient workflow is achieved. A 2-in-1 analysis solution can reduce significantly the cost and time for obtaining material image and composition data. Such data are instrumental in assuring quality and reliability to make confident decisions quickly during production, quality control, failure analysis, and research and development in industries and fields, such as automotive and metallurgy. https://www.leica-microsystems.com//science-lab/see-the-structure-with-microscopy-know-the-composition-with-laser-spectroscopy/ Mon, 11 Jun 2018 13:39:00 +0000 PhD James DeRose, Dr. Kay Scheffler https://www.leica-microsystems.com/20117 Metallography Leica is MAD about LIBS When analyzing material for cleanliness testing, users normally just want a simple way to know whether the particle under scrutiny is normal debris or something more risky. Users can now “LIBS” it to acquire rapidly the composition and then move onto the next manufacturing step. https://www.leica-microsystems.com//science-lab/leica-is-mad-about-libs/ Sun, 22 Apr 2018 22:00:00 +0000 Mike Tjepkema, PhD James DeRose https://www.leica-microsystems.com/19820 Quality Assurance Metallography Free Webinar On-Demand: New Cleanliness Workflow from Leica and Pall Obtaining cleanliness results rapidly, accurately, and reliably is a significant advantage for manufacturers and component suppliers. For this reason, Pall Corporation and Leica Microsystems have joined efforts to offer a new, unique workflow solution customizable to your individual needs. Join our free webinar to get a sneak preview on Leica Microsystems' new fully implemented LIBS (Laser Induced Breakdown Spectroscopy) system. This new landmark technology enables you to easily conduct fast and reliable optical and chemical cleanliness analysis with only one system. See for yourself how Leica Microsystems' new software and system solution facilitates and accelerates the identification of nature and source of particle contamination on components. https://www.leica-microsystems.com//science-lab/free-webinar-on-demand-new-cleanliness-workflow-from-leica-and-pall/ Wed, 06 Dec 2017 23:00:00 +0000 Dr. Nicol Ecke, Christophe Goasdoué https://www.leica-microsystems.com/19654 Quality Assurance Free Webinar On-Demand: Basics in Component Cleanliness Analysis For automotive manufacturers and auto parts suppliers, obtaining component cleanliness results rapidly, accurately, and reproducibly over the entire workflow is a significant advantage. Pall and Leica can make it easier. https://www.leica-microsystems.com//science-lab/free-webinar-on-demand-basics-in-component-cleanliness-analysis/ Wed, 26 Jul 2017 13:31:00 +0000 Dr. Nicol Ecke https://www.leica-microsystems.com/14798 Quality Assurance Cleanliness Analysis in Relation to Particulate Contamination Devices, products, and their components fabricated in many industries can be quite sensitive to contamination and, as a result, have stringent requirements for cleanliness. Measurement systems for automated particle analysis are often exploited for quantitative validation of product and component cleanliness to fulfill the needs of such industries as automotive, aerospace, microelectronics, pharmaceuticals, and medical devices. This report discusses the use of microscopy based measurement systems for automated particle analysis. https://www.leica-microsystems.com//science-lab/cleanliness-analysis-in-relation-to-particulate-contamination/ Mon, 08 Dec 2014 16:12:00 +0000 Yvonne Holzapfel, PhD James DeRose, Guido Kreck, PhD Markus Rochowicz https://www.leica-microsystems.com/12775 Quality Assurance Key Factors for Efficient Cleanliness Analysis In the automobile industry, even the smallest particles on single components can cause malfunctioning. Fuel, lubricant and urea filter systems are particularly vulnerable. Component cleanliness has therefore become a central quality characteristic in the modern manufacturing process, especially when fitting components of various suppliers. https://www.leica-microsystems.com//science-lab/key-factors-for-efficient-cleanliness-analysis/ Wed, 26 Feb 2014 12:27:00 +0000 Kerstin Pingel, Dr. Nicol Ecke https://www.leica-microsystems.com/12635 Quality Assurance Clean Parts – More Reliable and Longer Lifetime In the automotive industry, the technical cleanliness of function-critical individual and system components has become an increasingly critical criterion for reliability and service life. This trend is also reflected in ISO/DIS 16232 (road vehicles – cleanliness of components of fluid circuits). Microscope systems with corresponding analytical software enable efficient and reliable residual dirt analysis of injectors, pumps, control units and other micromechanical components. https://www.leica-microsystems.com//science-lab/clean-parts-more-reliable-and-longer-lifetime/ Mon, 24 Feb 2014 12:56:00 +0000 Dr. Kay Scheffler, Dipl. oec.-troph. Anja Schué https://www.leica-microsystems.com/12640 Quality Assurance Technical Cleanliness in the Production of Automotive Components Interview with Dr. Michael Härtel, head of the materials testing laboratory at Continental Automotive GmbH, Powertrain Division, Limbach-Oberfrohna, Germany https://www.leica-microsystems.com//science-lab/technical-cleanliness-in-the-production-of-automotive-components/ Mon, 14 Nov 2011 17:06:00 +0000 Dipl. oec.-troph. Anja Schué, Dr. Michael Härtel