Leica Science Lab - Tag : Material Analysis https://www.leica-microsystems.com//science-lab/tag/tags/material-analysis/show/Tag/ Article tagged with Material Analysis en-US https://www.leica-microsystems.com/24965 Digital Microscopy Stereo Microscopy Quality Assurance How to create EDOF (Extended Depth of Focus) images Watch this video to see how you can rapidly record sharp optical microscope images of samples with a large height variation. This is done with the optional Extended Depth of Focus (EDOF) function of the LAS X software from Leica Microsystems. Acquisition of EDOF images of a printed circuit board, recorded from low to high magnification using a Leica microscope, are shown as an example. The operation of EDOF by acquiring a z-stack of images in 3 modes is demonstrated. https://www.leica-microsystems.com//science-lab/how-to-create-edof-extended-depth-of-focus-images/ Wed, 08 May 2019 22:00:00 +0000 Clinton Smith, Mike Horz https://www.leica-microsystems.com/24967 Digital Microscopy Surface Metrology Quality Assurance Automated topographic analysis with the Leica Map software Watch this video to learn how you can save time when doing topographic analysis using the Leica Map software. The software allows you to go quickly from automated analysis of multiple sets of acquired topographic data to the reporting of precise results. https://www.leica-microsystems.com//science-lab/for-rapid-accurate-reporting-of-results/ Wed, 08 May 2019 22:00:00 +0000 Albert Laforet, PhD James DeRose https://www.leica-microsystems.com/20212 EM Sample Preparation Metallography Quality Assurance Stereo Microscopy 3-Dimensional Imaging of Macroscopic Defects in Aluminum Alloys The investigation of macroscale defects in aluminum (Al) alloys with a rapid 3-dimensional (3D) imaging approach is described in this report. Aluminum (Al) alloys play an important role in the production of aircraft and vehicles, as well as products in other industries. Defects present in the Al alloy used for the production of aircraft, vehicles, or other products can have a significant effect on their quality, performance, and lifetime. https://www.leica-microsystems.com//science-lab/3-dimensional-imaging-of-macroscopic-defects-in-aluminum-alloys/ Tue, 12 Jun 2018 22:00:00 +0000 PhD Wolfgang Grünewald, PhD James DeRose https://www.leica-microsystems.com/19946 Metallography Quality Assurance Rate the Quality of Your Steel: Free Webinar and Report This webinar and report describe optimal microscopy solutions for rating steel quality in terms of non-metallic inclusions and reviews the various international and regional standards concerning rigorous quality assessment methods, e.g., EN 10247, ASTM E45, DIN 50602, and ISO 4967. https://www.leica-microsystems.com//science-lab/rating-the-quality-of-steel/ Thu, 15 Feb 2018 23:00:00 +0000 Dionis Diez, PhD James DeRose, Thomas Locherer https://www.leica-microsystems.com/18124 Quality Assurance EM Sample Preparation Inspection of Multilayer Coating in the Automotive Industry Today’s automotive industry use a variety of decorative and functional treatment to improve the vehicles surfaces. Traditional quality control methods to inspect these multilayer samples have proven to be extremely time-consuming and bear the risk of missing defects. A new approach combining a target surface system and a light microscope offers new possibilities of speed and reliability. F. Javier Ruiz Balbas, Laboratory Manager at Atotech Spain, explains his experiences with the system. https://www.leica-microsystems.com//science-lab/fjavier-ruiz-balbas-atotec-the-leica-system-offers-flexibility-and-permissively-to-achieve-high-quality-results-in-short-time/ Mon, 30 May 2016 13:00:00 +0000 F.Javier Ruiz Balbas, Kerstin Pingel https://www.leica-microsystems.com/17665 Quality Assurance Digital Microscopy Automotive Industry: How Suppliers and Auto Manufacturers Can Verify Parts Specifications Quickly and Easily Checking specifications is critical: During the manufacture of auto parts, specifications must be met – whether by the auto parts supplier or the automobile manufacturer. It is important that the parts meet specifications as they are critical for maintaining the performance standards and safe operation of automobiles, trucks, and other vehicles during their lifetimes. https://www.leica-microsystems.com//science-lab/automotive-industry-how-suppliers-and-auto-manufacturers-can-verify-parts-specifications-quickly-and-easily/ Mon, 25 Apr 2016 08:21:00 +0000 PhD James DeRose, André Reinhold, Georg Schlaffer https://www.leica-microsystems.com/17370 Quality Assurance Digital Microscopy Automotive Industry: Rapid and Precise Surface Inspection on Hard-to-Image Samples In the automotive industry, microscopists may be challenged with samples that are difficult to image, for example, parts that have a special material composition. This report shows how the Leica DVM6 digital microscope helps to make inspection, measurement analysis, and reporting of such challenging samples quicker and easier. https://www.leica-microsystems.com//science-lab/automotive-industry-rapid-and-precise-surface-inspection-on-hard-to-image-samples/ Mon, 04 Jan 2016 09:58:00 +0000 PhD James DeRose, Georg Schlaffer https://www.leica-microsystems.com/17358 EM Sample Preparation TEM Sample Preparation Made Easy - Prepare TEM Specimen by Broad Beam Argon Ion Milling Quantitative and analytical analysis at high spatial resolution places stringent demands on the quality of the produced TEM specimens. Pristine and high-quality samples are indispensible for atomic resolution TEM analysis. In this application note a general procedure for obtaining cross-sectional and plan-view TEM specimens using the Leica EM RES102 ion milling system is outlined. The procedure described below can be easily adapted for a large range of materials e.g. thin film materials, semiconductors, multilayered materials, ceramics, superconductors, … https://www.leica-microsystems.com//science-lab/tem-sample-preparation-made-easy-prepare-tem-specimen-by-broad-beam-argon-ion-milling/ Tue, 15 Dec 2015 12:03:00 +0000 PhD Frédéric Leroux https://www.leica-microsystems.com/16804 EM Sample Preparation Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid” In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica Reference Site in Antwerp. This site, officially opened in July 2014, is dedicated to specimen preparation for electron microscopy in materials science with a special focus on ion beam milling and recently also on carbon coating. In this interview Prof Gustaf van Tendeloo, Director of EMAT, and Frédéric Leroux, TEM specimen preparation specialist, talk about research topics at EMAT, how the Leica reference site has evolved, and future trends for EM sample preparation. https://www.leica-microsystems.com//science-lab/electron-microscopy-sample-preparation-the-future-is-cold-dynamic-and-hybrid/ Thu, 22 Oct 2015 19:22:00 +0000 Prof. Gustaaf (Staf) Van Tendeloo, PhD Frédéric Leroux, Florence Hauger https://www.leica-microsystems.com/16093 Education Basics in Microscopy Microscopes Put to the Test with Severe Conditions: ISO Standard for Resistance of Optical Instruments to Fungus and Mold Growth Microscopes and other optical instruments can be affected during use by environmental factors. The environment depends on the geographic location and conditions of the place where the instrument is put to use. Usually, microscopes are manufactured in a way to ensure instrument robustness to a variety of conditions. https://www.leica-microsystems.com//science-lab/microscopes-put-to-the-test-with-severe-conditions-iso-standard-for-resistance-of-optical-instruments-to-fungus-and-mold-growth/ Wed, 05 Aug 2015 07:15:00 +0000 PhD James DeRose, Vince Vaccarelli https://www.leica-microsystems.com/15930 EM Sample Preparation High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the specimen surface should be exempt of any damages in order to produce EBSD patterns. Here, we present a successful and efficient EBSD sample polishing of two very challenging specimens prepared by broad ion beam milling. https://www.leica-microsystems.com//science-lab/high-quality-sample-preparation-for-ebsd-analysis-by-broad-ion-beam-milling/ Fri, 12 Jun 2015 20:30:00 +0000 PhD Laurie Palasse, PhD Wolfgang Grünewald https://www.leica-microsystems.com/13385 Surface Metrology Automated Digital 3D Topography Measurement with the Leica DCM 3D Dual Core Measuring Microscope The precise measurement of surface structures and topography is the key thing during the production, control and development in many sectors of industry or research. Because very often there is not possible to use some contact methods for performing this task new optical methods based on interferometry and confocal technology started to be available for non-contact surface metrology in the recent years. https://www.leica-microsystems.com//science-lab/automated-digital-3d-topography-measurement-with-the-leica-dcm-3d-dual-core-measuring-microscope/ Fri, 17 May 2013 09:39:00 +0000 https://www.leica-microsystems.com/4330 Conservation Restoration in an Open Workshop For more than a year from August 2007 through October 2008 museum visitors of the Statens Museum for Kunst, the Danish National Gallery in Copenhagen, were able to experience an open conservation studio in the exhibition area. The reason for bringing the conservators and all their equipment into the exhibition rooms of the museum was the conservation, restoration and technical research of Jacob Jordaens’ (1593 – 1678) early masterpiece “The Tribute Money. Peter Finding the Silver Coin in the Mouth of the Fish”, also known as “The Ferry Boat to Antwerp”. https://www.leica-microsystems.com//science-lab/restoration-in-an-open-workshop/ Mon, 14 Dec 2009 23:00:00 +0000 Anne Haack Christensen, Troels Filtenborg, Dr. Jørgen Wadum