Leica Science Lab - Tag : PCB https://www.leica-microsystems.com//science-lab/tag/tags/pcb/show/Tag/ Article tagged with PCB en-US https://www.leica-microsystems.com/18213 EM Sample Preparation Cross-Sectional Preparation of Structured Semiconductor Materials for TEM Application Note for Leica EM RES102 - The vertical layer construction of a semiconductor structure should be examined as a TEM cross-sectional sample. In addition to the specific preparation of the desired structure, the widely different sputter rates and atomic weights of the individual components represent the level of difficulty involved with this preparation problem. https://www.leica-microsystems.com//science-lab/cross-sectional-preparation-of-structured-semiconductor-materials-for-tem/ Mon, 31 Oct 2016 08:15:00 +0000 PhD Wolfgang Grünewald https://www.leica-microsystems.com/17945 Digital Microscopy Quality Assurance Image Gallery: Digital Microscopy Used in Microelectronics and Electronics Quality Control Quality Control in the electronics and microelectronics industry is confronted with many challenges: A variety of different materials in a sample, some of them metallic and reflective, some matt; a variety of material layers and heights, most often very intricate and hard to discern. Users in microelectronics quality control seek to identify deviations from the standard and improve the production processes so that defects are minimized or even eliminated. https://www.leica-microsystems.com//science-lab/galleries/image-gallery-digital-microscopy-used-in-microelectronics-and-electronics-quality-control/ Thu, 19 May 2016 11:23:00 +0000 PhD James DeRose, Claudia Müller https://www.leica-microsystems.com/17398 Quality Assurance Digital Microscopy Inspecting and Analyzing Printed Circuit Boards Quickly and Reliably with a Digital Microscope For the past several years, digital microscopy has been shown to be useful for inspection, quality control and assurance (QC/QA), and failure analysis (FA) in the microelectronics industry, especially for printed circuit boards (PCBs). Recently, state-of-the-art improvements have made digital microscopy even more powerful and practical for inspection, leading to a more efficient workflow. Here, the advantages of certain digital microscope features, i.e., intuitive software for operation and analysis, fast and easy ways to change magnification, and encoding for reliable recall of parameters, are explained. https://www.leica-microsystems.com//science-lab/inspecting-and-analyzing-printed-circuit-boards-quickly-and-reliably-with-a-digital-microscope/ Mon, 11 Jan 2016 09:09:00 +0000 PhD James DeRose, Georg Schlaffer