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Webinar: Innovative Sample Preparation Method of Heterogeneous Materials for EM Observation

Scientists show their results in artifact-free diamond / Al composite surface

Sample Preparation is a prerequisite for microscopy. It’s essential for achieving accurate and reproducible results. To get the best results in interfacial characterization, Leica Microsystems developed a triple ion beam cutting technique for electron microscopy observation. This technique is integrated into the ion beam slope cutter Leica EM TIC 3X and optimizes the processing conditions of sample preparation to reveal the nano-sized interfacial features of the specimen.

On May 27, Dr. Gang Ji and Dr. Wolfgang Grünewald will present their results in artifact-free diamond/Al composite surface for interface characterization without mechanical pre-polishing, using the innovative cutting method by Leica Microsystems.

Figure: Diamond (30 micron)/Al composite: (a) Standard mechanical polishing – (b) Triple Ion Beam polishing. Copyright © Dr. Gang Ji


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Gang Ji, PhD

Materials Scientist
Lille University

Wolfgang Grünewald, PhD

Application Specialist, Solid states
Leica Microsytems – Nanotechnology Division