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Webinar: Optimizing Accuracy and Repeatability of Microscope-Based Measurement Systems

The modern microscope has evolved into the instrument of choice for extracting fast and reliable measurement data in the R&D, quality control, and production workplaces. However, many instruments are not fully optimized to produce accurate, repeatable, and reproducible measurement data.

In this webinar, attendees will learn about: state-of-the-art telecentric optics, application-specific, optimized optical components, the latest digital cameras and metrology software and how to increase measurement certainty and throughput.

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Speakers

 

Mario J. Gislao

Imaging Specialist
Leica Microsystems, Industry Division

Mario J. Gislao is the Eastern Regional Imaging Manager for Leica Microsystems. He has more than 15 years of experience in industrial microscopy, digital micro-imaging and metrology. He has a degree in electrical engineering from the State University of New York.

 

Clinton Smith

Product Manager
Leica Microsystems, Industry Division

Clinton Smith is a Product Manager at Leica Microsystems in Heerbrugg, Switzerland, who hails from Cleveland. Although a chemical engineer by training, Smith is part of the team that developed and recently released an innovative digital microscope that does not use eyepieces for inspection.