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Webinar: Sample Preparation of Nanocomposites and Nanomaterials by Ultramicrotomy - a Powerful Alternative to FIB

This webinar will discuss the latest techniques to reveal internal structures of composites and polymers being investigated with transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM).

Sample preparation workflow will be illustrated using the Leica EM UC7 Ultramicrotome, its EM FC7 Cryochamber, and the EM TXP pre-preparation system. Differences between FIB (Focussed Ion Beam) and ultramicrotomy samples will also be covered.

Who Should Attend:

  • Composite and polymer research companies - especially from the automotive and aviation industries
  • Materials scientists already working with ultramicrotomy
  • FIB users preparing TEM lamellas


Topics & Tags

Table of Content


Frédéric Leroux

EM Sample Preparation Specialist

Robert Ranner

Product Manager
Leica Microsystems