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Electron Microscope Sample Preparation

Excellent Sample Preparation is a prerequisite for perfect microscopy. Leica Microsystems offers the most comprehensive product portfolio for the preparation of biological, medical and industrial samples.


Preparation for many applications

Our products allow perfect preparation of samples for examination in the Electron Microscope (TEM – Transmission Electron Microscope and SEM – Scanning Electron Microscope), LM (Light Microscope), Confocal Microscope and AFM (Atomic Force Microscope).

Precise and easy to use instruments

Our instruments for Sample Preparation meet the highest demands in technology and ergonomy, helping you to achieve high-precision results in the field of nanotechnology.


EM Sample Preparation Products

EM Sample Preparation News

Workshop for 3D Reconstruction in Cryo Electron Microscopy at Maastricht University

July 6 to 10, 2015

See how Sample Preparation from Leica Microsystems Enhances 3D Reconstruction...

Webinar: Sample Preparation Techniques for Scanning Electron Microscopy of Industrial Samples

May 26, 2015

Andreas Nowak presents triple ion beam cutting technique with the Leica EM TIC 3X as...

Latest Advances in Light, Confocal and Super-Resolution Microscopy

May 19 to 22, 2015

Leica Microsystems at the ELMI 2015 in Sitges, Spain