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Sample Preparation for Electron Microscopy

When it comes to great results, stunning performance or breakthrough discoveries, you will find one thing that all of them have in common: their precise and careful preparation. Especially in the field of electron microscopy, perfect sample preparation is a prerequisite and crucial step.

Be prepared – for great results!

Leica Microsystems offers the most comprehensive product portfolio for preparation of biological, medical and industrial samples. Concentrating on workflow solutions we provide a product range that is perfectly aligned to all your needs for precise sample preparation in TEM, SEM, and AFM investigations. Each Leica solution consists of several instruments that are perfectly geared to one another to form a seamless workflow for your sample.

Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!


EM Sample Preparation Products

EM Sample Preparation News

Register to basic & advanced electron microscopy courses

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2017 electron microscopy courses at CMC Utrecht, NL (January & June 2017)

Freeze the moment of your discovery

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Find out how electrical stimulation will help you visualize cellular activity in your sample preparation for electron microscopy.

Imaging of Host Cell-bacteria Interactions using Correlative Microscopy under Cryo-conditions

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Martin Strnad, Academy of Sciences of the Czech Republic, explains how he utilized CLEM to investigate interactions between Borrelia burgdorferi and mammalian cell lines.

Inspection of Multilayer Samples - Workflow in Quality Control

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A new approach to create an efficient, fast and precise workflow in Quality Control

Quality control of multilayer coatings on metal and plastic samples, like it is daily routine in automotive or microelectronic industry, requires a rather time...

Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

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Interview with Staf van Tendeloo and Frédéric Leroux from the Leica Reference Site at EMAT (Electron Microscopy for Materials Science), University of Antwerp

Precise Polishing for Reliable Measurements

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How to use the Leica EM TXP target surfacing system to prepare small disk-shaped samples for capacitance and pyroelectric current measurements