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Electron Microscope Sample Preparation

Excellent Sample Preparation is a prerequisite for perfect microscopy. Leica Microsystems offers the most comprehensive product portfolio for the preparation of biological, medical and industrial samples.


Preparation for many applications

Our products allow perfect preparation of samples for examination in the Electron Microscope (TEM – Transmission Electron Microscope and SEM – Scanning Electron Microscope), LM (Light Microscope), Confocal Microscope and AFM (Atomic Force Microscope).

Precise and easy to use instruments

Our instruments for Sample Preparation meet the highest demands in technology and ergonomy, helping you to achieve high-precision results in the field of nanotechnology.


EM Sample Preparation Products

EM Sample Preparation News

Workshop for Sample Preparation for EM and TEM Microscopy at Rey Juan Carlos University, Madrid, Spain

March 24, 2015

Introduction to Sample Preparation for Different Materials

16. to 18. March: Three-Day Cryo CLEM Workshop at the Institute of Parasitology at the Biology Center ASCR in České Budějovice, Czech Republic

Three-Day Cryo CLEM Workshop at the Institute of Parasitology at the Biology Center ASCR in České Budějovice, Czech Republic

March 16 to 18, 2015

Leica Microsystems Presents State-of-the-Art Solution for Analysis of Cryo...

The Leica EM TIC 3X ion beam milling system is now available with vacuum cryo transfer docking port for convenient transfer of room-temperature or cryo samples.

Leica Microsystems’ Ion Beam Milling System Leica EM TIC 3X Now Available With Vacuum Cryo Transfer Docking Port

November 20

Vacuum Cryo Transfer (VCT) Ensures Samples Keep Their Phase During EM Sample Prep

Five-Day Workshop on EM Sample Preparation for Industrial Materials in Vienna, Austria

November 17 - 21, 2014

Learn More About Room-Temperature and Cryo Sample Preparation Through...