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Electron Microscope Sample Preparation

Excellent Sample Preparation is a prerequisite for perfect microscopy. Leica Microsystems offers the most comprehensive product portfolio for the preparation of biological, medical and industrial samples.

Preparation for many applications

Our products allow perfect preparation of samples for examination in the Electron Microscope (TEM – Transmission Electron Microscope and SEM – Scanning Electron Microscope), LM (Light Microscope), Confocal Microscope and AFM (Atomic Force Microscope).

Precise and easy to use instruments

Our instruments for Sample Preparation meet the highest demands in technology and ergonomy, helping you to achieve high-precision results in the field of nanotechnology.

EM Sample Preparation Products

EM Sample Preparation News

Correlative Fluorescence and (Cryo-) Electron Microscopy

Published: 24 July 2015

Webinar: Identifying Objects of Interest and Imaging in 3D in The Transmission Electron Microscope

Innovative Solutions for Electron Microscopy Sample Preparation and Microscopic Imaging at Microscopy & Microanalysis

Published: 24 July 2015

August 3 to 6, 2015

Free Sample Preparation Tutorials With Latest Electron Microscope Preparation...

Visit Leica Microsystems’ booth #706 at the Microscience Microscopy Congress (MMC) 2015, June 30 to July 2, in Manchester

Advance Your Microscopy and Sample Preparation Knowledge Base at MMC 2015 in Manchester, UK

Published: 29 June 2015

Free Hands-on Workshops and In-Booth Demonstrations

Visit Leica Microsystems’ booth #706 at the...

Vienna Plant Certified for DIN EN ISO 14001

Published: 15 June 2015

Electron Microscopy Sample Preparation Business Proves Environmental Commitment

Leica Microsystems launches Leica EM Cryo CLEM, a system that facilitates correlative light and electron microscopy (CLEM), allows rapid screening of large areas and fast determination of regions of interest

Leica Microsystems Combines Advantages of Cryo Fixation, Fluorescence Light Microscopy and Electron Microscopy in One System

Published: 19 March 2015

Leica EM Cryo CLEM Features the World’s First Cryo CLEM Objective

Course for Cryo-Electron Tomography at the Campus Science Support Facility in Vienna

Published: 09 March 2015

June 6 to 7 Pre-Course, June 8 to 12 Main Course

Working with Dedicated Cryo-Instrumentation, the...