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Electron Microscope Sample Preparation

Excellent Sample Preparation is a prerequisite for perfect microscopy. Leica Microsystems offers the most comprehensive product portfolio for the preparation of biological, medical and industrial samples.

Preparation for many applications

Our products allow perfect preparation of samples for examination in the Electron Microscope (TEM – Transmission Electron Microscope and SEM – Scanning Electron Microscope), LM (Light Microscope), Confocal Microscope and AFM (Atomic Force Microscope).

Precise and easy to use instruments

Our instruments for Sample Preparation meet the highest demands in technology and ergonomy, helping you to achieve high-precision results in the field of nanotechnology.

EM Sample Preparation Products

EM Sample Preparation News

Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

Published: 05 November 2015

Interview with Staf van Tendeloo and Frédéric Leroux from the Leica Reference Site at EMAT...

Precise Polishing for Reliable Measurements

Published: 17 September 2015

How to use the Leica EM TXP target surfacing system to prepare small disk-shaped samples for...

Gareth Jackson Proudly Presents: The New Leica EM ICE High-Pressure Freezer

Published: 14 September 2015

Video Interview by Dr. Chris Parmenter, Editor of Micorscopy and Analysis About our Latest...

New Insights Are Just a Millisecond Away

Published: 18 August 2015

Leica Microsystems Launches High Pressure Freezer with Integrated Light Stimulation for...

What You Always Wanted to Know About High-Pressure Freezing

Published: 18 August 2015

A Brief Introduction by Dr. Cveta Tomova



Impossible? Not for Those who are Prepared to See High-Pressure Freezing and Light Stimulation with a Millisecond Precision!

Published: 12 August 2015

Register now for Workshops at Multinational Congress on Microscopy in Eger, Hungary, and Microscopy...