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Electron Microscope Sample Preparation

Excellent Sample Preparation is a prerequisite for perfect microscopy. Leica Microsystems offers the most comprehensive product portfolio for the preparation of biological, medical and industrial samples.


Preparation for many applications

Our products allow perfect preparation of samples for examination in the Electron Microscope (TEM – Transmission Electron Microscope and SEM – Scanning Electron Microscope), LM (Light Microscope), Confocal Microscope and AFM (Atomic Force Microscope).

Precise and easy to use instruments

Our instruments for Sample Preparation meet the highest demands in technology and ergonomy, helping you to achieve high-precision results in the field of nanotechnology.


EM Sample Preparation Products

EM Sample Preparation News

Workshop for 3D Reconstruction in Cryo Electron Microscopy at Maastricht University

July 6 to 10, 2015

See how Sample Preparation from Leica Microsystems Enhances 3D Reconstruction...

Course for Cryo-Electron Tomography at the Campus Science Support Facility in Vienna

June 6 to 7 Pre-Course, June 8 to 12 Main Course

Working with Dedicated Cryo-Instrumentation, the...

The Leica EM TIC 3X ion beam milling system is now available with vacuum cryo transfer docking port for convenient transfer of room-temperature or cryo samples.

Leica Microsystems’ Ion Beam Milling System Leica EM TIC 3X Now Available With Vacuum Cryo Transfer Docking Port

November 20

Vacuum Cryo Transfer (VCT) Ensures Samples Keep Their Phase During EM Sample Prep