DM8000 M & DM12000 M
정립 현미경
광학 현미경
제품소개
홈
Leica Microsystems
DM8000 M & DM12000 M 광학 검사 시스템
신속한 결함 감지, 의사 결정 개선
최신 기사를 읽어 보세요
Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Burr Detection During Battery Manufacturing
See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
How to Boost your Microelectronic Component Inspection Performance
Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?
Watch this free webinar…
Brief Introduction to Surface Metrology
This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…
적용 분야
검사 현미경
라이카마이크로시스템즈는 다양한 산업 분야를 위한 검사 현미경과 각종 액세서리를 제공합니다. 당사의 전문가가 최적의 솔루션을 찾을 수 있도록 도와드립니다.
