Measurement Microscopes from Leica Microsystems
Measurement microscopes play a very important role at many production sites and development laboratories in the automotive, transportation, electronics, medical device, and watch industries. As a device manufacturer or supplier, you can spend many hours inspecting and documenting components and parts for quality control, failure analysis and R&D.
Leica Microsystems offers a variety of measurement microscopes with a range of accessories. Get in touch with Leica experts who can help you find the solution that best fits your specific measurement needs.
Talk to our imaging experts. We are happy to answer all your questions and concerns.
Featured Product
Emspira 3
Streamline your inspection process
Make Emspira 3 your integrated solution for comparison, measurement, and data sharing, allowing you to optimize your inspection and ditch the PC.
Inspect with a single system
Emspira 3 helps you to perform comprehensive visual inspection tasks without a PC. Its integrated on-screen display (OSD) provides intuitive tools for stand-alone operation. Gone are the days of changing between workstations!
Save time with quick sample identification
Record and identify your sample quickly with a barcode scanner. What’s more, you can always trace your image back to your sample by automatically recording the identifier code with the acquired image.
Featured Product
Microscope Software Platform Enersight
Inspect and measure with a single system
Measure directly during visual inspection without a PC
- Take measurements on the go using the software displayed on your screen.
- Measure multiple sample features in the live image and save the results together with the image.
- Get more functionality with Enersight's measurement tool that allows measuring between any two points.
- Use snap-to-edge assistance for accurate measurements.
Directly compare to references with a single click
- Make pass/fail decisions a breeze by directly comparing your live image to reference images or customized overlays.
- Judge whether your sample is out of specification by overlaying tolerance lines on the image.
Extend LAS X capabilities for image acquisition and documentation of single images
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