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Leica DM12000 M Sistema de análise e inspeção de precisão de 12"
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Burr Detection During Battery Manufacturing
See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
How to Boost your Microelectronic Component Inspection Performance
Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?
Watch this free webinar…
Brief Introduction to Surface Metrology
This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…
Campos de aplicação
Processamento de pastilhas semicondutoras, embalagem, montagem e testes de circuitos integrados
Leica Microsystems’ customized, modular imaging solutions help suppliers and device manufacturers achieve fast and precise inspection and analysis for wafer processing, IC packaging, IC assembly, and…
Mercados de microscopia industrial
Maximizar o tempo de atividade e atingir as metas de forma eficiente ajuda seu resultado final. As soluções de microscópio Leica podem fornecer uma visão dos menores detalhes da amostra, bem como…
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