Overcoming the resolution criterion
05 May 10:00 UTC online, United Kingdom
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How to boost your microelectronic component inspection performance!
Are you working in semiconductor or microelectronics production? Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get the amazingly sharp and detailed sample images only electron microscopes can provide?
Then you should join our free webinar to learn more about powerful imaging & contrasting techniques that can significantly change your inspection performance. Using real customer examples, our expert Michael Doppler will show you how to overcome the resolution criterion to achieve the inspection results you are aiming for - without oil immersion or transfer to SEM/REM. During the live Q&A session you will have the opportunity to present your case and discuss your questions.
If you can't attend the live webinar but are still interested in the topic, don't worry. Register and we will send you the link to the recorded event so you can watch it anytime.