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Leica DM12000 M Contrôle de précision de 12 po et système de révision

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How to Boost your Microelectronic Component Inspection Performance

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…

Brief Introduction to Surface Metrology

This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…

Domaines d'application

Production de wafers semiconducteurs

Leica Microsystems’ customized, modular imaging solutions help suppliers and device manufacturers achieve fast and precise inspection and analysis for wafer processing, IC packaging, IC assembly, and…

Marchés de la microscopie industrielle

L'optimisation du temps de fonctionnement et la réalisation efficace des objectifs contribuent à votre résultat net. Les solutions de microscopie de Leica peuvent vous donner un aperçu des plus petits…
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