Hands-On Sample Preparation Workshop with UC Enuity

Join JH Technologies and Leica Microsystems for a hands-on workshop focused on electron microscopy and AFM sample preparation. The workshop will include technical instruction, live demonstrations and practical sessions with the UC Enuity ultramicrotome.

Participants will learn about ultramicrotomy in the context of materials research and failure analysis and take part in practical sample preparation activities. Prepared samples can also be viewed using optical microscopy and SEM imaging.

Workshop topics

• Ultra-thin sectioning for TEM sample preparation
• Block-face and cryo preparation for SEM, AFM and optical microscopy
• Sectioning of polymers, coatings, elastomers, multilayer materials and composites
• Sectioning of samples brought or submitted by participants

Workshop format and times

Each small-group session includes approximately 30 minutes of technical instruction, followed by demonstrations and practical sample preparation. Attendance is limited to five participants per session, allowing time for practical activities and interaction with the workshop experts.

Tuesday, October 27 to Thursday, October 29

9:00 AM–12:00 PM or 1:00 PM–4:00 PM

Places are limited.

Reserve your workshop session