Leica EM RES102 Fresado con haz de iones Preparación de muestras de ME Productos Inicio Leica Microsystems

Sistema de fresado con haz de iones Leica EM RES102

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This item has been phased out. Please contact your sales person with possible substitutions.

Leica EM RES102

Notas de la aplicación
AN EMRES101 EMRES102 Cleaning and Ion Polishing of Soft Metals EN PDF, 4 MB
AN EMRES101 EMRES102 Cross Section of Solder Ball EN PDF, 3 MB
AN EMRES101 EMRES102 Ion polished cross section of gold wire bonding 2 EN PDF, 3 MB
AN EMRES101 EMRES102 Ion polished cross section of gold wire bonding EN PDF, 3 MB
AN EMRES102 Ceramics EN PDF, 5 MB
AN EMRES102 Cleaning of Smeared Sample Surfaces EN PDF, 3 MB
AN EMRES102 Contact Hole Structures EN PDF, 3 MB
AN EMRES102 Contrast Enhancement of Multi Layer Systems EN PDF, 3 MB
AN EMRES102 Contrast Enhancement of Semiconductor Structures EN PDF, 4 MB
AN EMRES102 Contrast Enhancement of Polyerystalline Metals EN PDF, 3 MB
AN EMRES102 In-Containing Compound Semiconductors EN PDF, 3 MB
AN EMRES102 Ion Beam Polishing of sample surfaces EN PDF, 3 MB
AN EMRES102 Metal Films and Sheets EN PDF, 4 MB
AN EMRES102 Multi-Layer Systems With Widely Different Sputter Rater EN PDF, 4 MB
AN EMRES102 Paper Samples EN PDF, 3 MB
AN EMRES102 Porous Ceramics EN PDF, 3 MB
AN EMRES102 Removal of Surface Layers EN PDF, 3 MB
AN EMRES102 Semiconductor Structures With Large Differences In Hardness EN PDF, 3 MB
AN EMRES102 Shallow Trench Isolation Structures EN PDF, 3 MB
AN EMRES102 Surface Modification Of ZnAg Sample EN PDF, 4 MB
AN EMRES102 Thin Metal Foils With Coatings EN PDF, 3 MB
Catálogos
EM RES102 Brochure CHN 05 18 CN PDF, 1 MB
Leica EM RES102 Brochure EN PDF, 1 MB
LNT Product Portfolio 01 20 PDF, 1 MB
Certificados
EC DoC EM RES102 RUO 253-2 PDF, 49 KB
EC Declaration 07 17 EM RES102 PDF, 71 KB