EM TXP Dispositivo de corte transversal

El punto de partida para el corte transversal de muestras para su examen mediante microscopía electrónica y óptica.

Learn more about the Leica EM TXP Target surfacing System

The Leica EM TXP is a unique target preparation device especially developed for cutting, milling, drilling, grinding and polishing samples prior to examination by SEM, TEM and LM techniques.

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