Efficiency and flexibility
Fresa per taglio inclinato a fascio ionico Leica EM TIC 3X

Various Sample Holders
Various sample holders for almost every sample size and a wide range of use are available e.g. one sample holder for the complete process from mechanical pre-preparation (Leica EM TXP) to ion beam slope cutting (Leica EM TIC 3X) to SEM investigation to the point of storage.