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Leica EM TIC 3X Ion Beam Milling Systems Sample Preparation for Electron Microscopy Products Home Leica Leica Microsystems
Efficiency and flexibility

Fresa per taglio inclinato a fascio ionico Leica EM TIC 3X

Standard Stage

Standard Stage

Standard stage for routine applications and contrast enhancement of the prepared surface.

Multiple Sample Stage

Multiple Sample Stage

Multiple sample stage is used if high throughput is desired. Three samples can be loaded and automatically processed in the Leica EM TIC 3X in one session (e.g. overnight) without any user interaction.

Cooling stage

Cooling stage

Cooling stage provides very low temperature processing. With temperatures of the sample holder and mask down to -150°C, extremely heat sensitive samples such as rubber, water soluble polymer fibers or even marshmallows (if desired) can be processed to a high quality.

Various Sample Holders

Various Sample Holders

Various sample holders for almost every sample size and a wide range of use are available e.g. one sample holder for the complete process from mechanical pre-preparation (Leica EM TXP) to ion beam slope cutting (Leica EM TIC 3X) to SEM investigation to the point of storage.