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Revealing Sodium Battery Degradation via Cryo-EM and CryoFIB
Explore how cryogenic electron microscopy and focused ion beam techniques uncover the intrinsic structure of sodium battery interfaces. This webinar presents a new degradation model based on separator…
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Integrated Serial Sectioning and Cryo-EM Workflows for 3D Biological Imaging
This on-demand webinar explores how integrated tools can support electron microscopy workflows from sample preparation to image analysis. Experts Andreia Pinto, Adrian Boey, and Hoyin Lai present the…
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Analyzing Non-metallic Inclusions in Steel
Oftentimes we find ourselves caught up in tedious analyses by reticle and comparison chart, time-consuming double-evaluation according to several standards or subjective inspection results with a bias…
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Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
