Leica EM TXP Ion Beam Milling EM Preparazione del campione Prodotti Home Leica Microsystems
Learn more about the Leica EM TXP Target surfacing System

Learn more about the Leica EM TXP Target surfacing System

The Leica EM TXP is a unique target preparation device especially developed for cutting, milling, drilling, grinding and polishing samples prior to examination by SEM, TEM and LM techniques.