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Leica DM12000 M 半導体検査顕微鏡(12インチウエハ用)<br>

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Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
Wafer

How to Boost your Microelectronic Component Inspection Performance

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…

Brief Introduction to Surface Metrology

This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…

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半導体検査

顕微鏡とサンプル調製ソリューションで、ウエハー加工、ICパッケージング、組み立ておよび試験のため、迅速で信頼性の高いウエハーおよび半導体検査を実現します。

工業用顕微鏡のマーケット

稼働時間を最大化し、生産性向上により、お客様の収益に貢献します。ライカの顕微鏡(マイクロスコープ)ソリューションは、微細な異物や残渣なども見逃しなく、迅速かつ信頼性の高い分析、文書化、結果報告を実現します。ライカマイクロシステムズは、幅広いソリューションとエキスパートによるサポートを提供し、さまざまなアプリケーションのニーズにお応えします。
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