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Leica EM TXP Système mécanique de surfaçage et ciblage

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Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.

How to Prepare and Analyse Battery Samples with Electron Microscopy

This online workshop is designed for beginners as well as advanced EM users for lithium or novel battery systems, as well as other semiconductor samples requiring high-resolution cross-section…
SEM image of the full Li-NMC electrode sample, showing the two porous layers and the metal film at the center of the structure.

Cross Section Ion Beam Milling of Battery Components

Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Domaines d'application

Industrie Horlogère Microscopes

Pour les horlogers et l'industrie horlogère, la haute précision des stéréomicroscopes Leica facilite l'assemblage de montres et l'inspection fiable nécessaire à une excellente qualité et à une…

Industrie automobile et transport

Améliorez la fiabilité et la précision de votre travail dans le secteur de la production automobile et des transports. Les solutions d'imagerie microscopique de Leica Microsystems améliorent votre…

Microscopes pour analyse de matériaux

L’analyse de matériaux nécessite des solutions de microscope pour l’imagerie, la mesure et l’analyse de caractéristiques dans divers matériaux tels que les alliages métalliques, les semiconducteurs,…

Marchés de la microscopie industrielle

L'optimisation du temps de fonctionnement et la réalisation efficace des objectifs contribuent à votre résultat net. Les solutions de microscopie de Leica peuvent vous donner un aperçu des plus petits…
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