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  • Microscopi per le industrie automobilistica e dei trasporti

    L’ obiettivo di Leica è essere il vostro affidabile collaboratore che vi guida verso le soluzioni di imaging migliori per le vostre esigenze, per consentirvi di essere sempre un passo avanti alla…
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  • Microscopi per l'ingegneria dei metalli e delle macchine

    Chi lavora nell'ingegneria dei metalli e delle macchine ha bisogno di soluzioni di microscopia con imaging in grado di aiutare ad assemblare, controllare, misurare, analizzare e documentare i…
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  • Microscopi per le industrie energetica, mineraria e delle risorse naturali

    Energizing the worlds infrastructure while maintaining sustainability is always a priority. Leica Microsystems offre soluzioni di microscopia potenti e personalizzabili per aiutare a sfruttare al…
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  • Microscopi per l'industria della lavorazione del ferro e dell'acciaio

    Chi opera nell'industria della lavorazione del ferro e dell'acciaio svolge compiti specializzati che richiedono l'utilizzo di microscopi personalizzati in grado di aiutare a controllare, analizzare o…
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  • Introduction to Ion Beam Etching with the EM TIC 3X

    In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…
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  • Workflow Solutions for Industrial Research

    This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
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  • Studying the Microstructure of Natural Polymers in Fine Detail

    The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
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  • Practical Applications of Broad Ion Beam Milling

    Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
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  • Cross Sectioning of Cadmiumsulphide (CdS) for Cathodoluminescence

    Cathodoluminescence can be used to achieve spectra and high resolution images of impurity and structural defects in semicondoctors, minerals and insulating materials. This application note explains…
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  • Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Cross Section of Solar Cells

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Cross section of a complete solar cell.
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  • Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Cross Sectioning of Ni/Cu on Steel for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Cross Sectioning of Painted Concrete

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cuts of material combinations consisting of hard and soft materials. Here, cross sectioning of painted…
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  • Cross Sectioning of a Superconductive Wire

    Application Note for Leica EM TIC 3X - Purpose: The shape of the wire is difficult for ion beam slope cutting. Goal: Cross sectional preparation to see the structure of the wire.
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  • Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation…
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  • Cross Sectioning of Alumina

    Application Note for Leica EM TIC 3X - Alumina is very difficult to handle and almost impossible to prepare with conventional methods. Ion beam slope cutting is a method that can achieve cross…
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  • Cross Sectioning of CuSn Connector of a Solar Cell

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cross sections of soft materials or material combinations consisting of hard and soft components. The…
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  • Cross Sectioning of Oil Shale Rock

    Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently…
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  • Cross Sectioning of Rubber (Tire)

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components.
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  • Cross Sectioning of Basalt Fibres

    Application Note for Leica EM TIC 3X - Material Research. Purpose: The fibres are embedded in a soft matrix. That makes it difficult to prepare a cross section. Goal: Cross section of the basalt…
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  • Triple-beam Ar-Ion-Milling with a Rotary Stage to Decorate Grain Boundaries and Substructures in Rock Salt

    Decoration of grain boundaries in polycrystalline rocks has a long tradition in Structural Geology as in a monomineralic rock the recrystallized grain size is a good indicator for the paleostress…
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  • Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica…
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  • A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples

    In June 2014, the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris became a Leica reference lab for EM Sample Preparation…
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  • High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling

    Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the…
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  • Partner Lab for EM Sample Preparation in Paris

    At the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris an new lab for EM Sample Preparation welcomes researchers of…
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  • Analysis of Oil Shale as an Alternative Source of Energy

    For some years now, the search for alternative sources of raw materials has concentrated on oil shale deposits. As the exploitation of these raw materials is still extremely complex and expensive,…
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  • Triple Ion Beam Cutting of Diamond/Al Composites for Interface Characterization

    The microstructure of new materials with heterogenic components is extremely difficult to study. As mechanical polishing often not leads to smooth surfaces, a novel ion beam cutting technique has…
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  • A Word on Cathodoluminescence

    Cathodoluminescence microanalysis is an emerging technique that is fast gaining popularity in the world of materials science. CL is a light emission phenomena resulting from the electron beam…
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  • University of Wollongong Electron Microscopy Centre

    The University of Wollongong has a diverse range of materials research programs that includes metallurgy for mining, manufacturing, steel making and transport; polymers for solar cells, energy storage…
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