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Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Structural and Chemical Analysis of IC-Chip Cross Sections
This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
Cross Section Ion Beam Milling of Battery Components
Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…
Download EM Workflow Solutions Booklet
This publication is a compilation of appropriate workflows for the most frequently used sample preparation methods, like Correlative Methodologies, Optogenetics & Electro-Physiology, Surface Analysis,…
Exploring the Structure and Life Cycle of Viruses
The SARS-CoV-2 outbreak started in late December 2019 and has since reached a global pandemic, leading to a worldwide battle against COVID-19. The ever-evolving electron microscopy methods offer a…
Application Booklet for EM TIC 3X
Today, ion beam milling is one of the most widely-used methods for preparing samples for electron microscopy. Download this 76-pages booklet today and learn how to improve your processes.
Workflows and Instrumentation for Cryo-electron Microscopy
Cryo-electron microscopy is an increasingly popular modality to study the structures of macromolecular complexes and has enabled numerous new insights in cell biology. In recent years, cryo-electron…
Introduction to Ion Beam Etching with the EM TIC 3X
In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…
Workflow Solutions for Sample Preparation Methods for Material Science
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Studying the Microstructure of Natural Polymers in Fine Detail
The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
Macroscale to Nanoscale Pore Analysis of Shale and Carbonate Rocks
Physical porosity in rocks, like shale and carbonate, has a large effect on the their storage capacity. The pore geometries also affect their permeability. Imaging the visible pore space provides…
Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
Battery Manufacturing
Battery manufacturing has several key challenges concerning inspection. Solutions for sample preparation and microscopic visual and chemical analysis are needed.
Campos de aplicación
Microscopios para la industria del automóvil y el transporte
Nuestras soluciones inteligentes para la captura y procesamiento de imágenes le ayudan a dirigir aplicaciones especiales con las que satisfacer sus necesidades, tanto presentes como futuras, lo que le…
Microscopios para la industria energética, minera y de recursos naturales
Leica Microsystems dispone de soluciones de microscopía potentes y personalizables para ayudarle a aprovechar al máximo sus recursos, guiarle en sus nuevos proyectos, desarrollar el próximo tipo de…
Microscopios para análisis de materiales
El análisis de materiales requiere microscopios para la obtención de imágenes, la medición y el análisis de características de diversos materiales, como aleaciones metálicas, semiconductores, vidrio y…
Mercados de microscopía industrial
Maximizar el tiempo de actividad y alcanzar los objetivos de forma eficiente ayudan a su cuenta de resultados. Las soluciones de microscopía de Leica le permiten conocer hasta el más mínimo detalle de…
Análisis de cortes transversales para la microelectrónica
El análisis de sección transversal para la electrónica permite un análisis detallado de los mecanismos de fallo de componentes como placas de circuito impreso (PCB), montajes (PCBA) y circuitos…
Industria electrónica y de semiconductores
Para la electrónica y los semiconductores, las soluciones que permiten una inspección eficiente, el análisis de la sección transversal y de la limpieza, y la I+D de PCB, obleas, chips IC y baterías…
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