Eficiencia y flexibilidad
Sistema de corte y pulido con haz de iones Leica EM TIC 3X
Microscopios para la industria del automóvil y el transporte
En Leica, queremos ser sus colaboradores más fiables y guiarle hacia las mejores soluciones para la formación de imágenes, de modo que pueda permanecer por delante de sus competidores.
Nuestras…
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Microscopios para la ingeniería de metales y maquinaria
Su trabajo en la ingeniería de metales y maquinaria requiere soluciones de adquisición de imágenes para microscopía que le ayuden a ensamblar, inspeccionar, medir, analizar y documentar sus resultados…
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Microscopios para la industria energética, minera y de recursos naturales
Nuestra prioridad es siempre potenciar las infraestructuras del planeta sin descuidar la sostenibilidad. Leica Microsystems dispone de soluciones de microscopía potentes y personalizables para…
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Microscopios para la industria del hierro y del acero
Su papel en la industria del hierro y del acero es especializado y requiere soluciones de microscopía individualizadas que le ayuden a inspeccionar, analizar o documentar el desarrollo, la composición…
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Science Lab Topic:
EM Sample Preparation
Workflows and Instrumentation for Cryo-electron Microscopy
Cryo-electron microscopy is an increasingly popular modality to study the structures of macromolecular complexes and has enabled numerous new insights in cell biology. In recent years, cryo-electron…
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Science Lab Topic:
EM Sample Preparation
Introduction to Ion Beam Etching with the EM TIC 3X
In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…
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Science Lab Topic:
EM Sample Preparation
Workflow Solutions for Industrial Research
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
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Science Lab Topic:
EM Sample Preparation
Studying the Microstructure of Natural Polymers in Fine Detail
The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
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Science Lab Topic:
EM Sample Preparation
Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Cadmiumsulphide (CdS) for Cathodoluminescence
Cathodoluminescence can be used to achieve spectra and high resolution images of impurity and structural defects in semicondoctors, minerals and insulating materials. This application note explains…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)
Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping,…
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Science Lab Topic:
EM Sample Preparation
Cross Section of Solar Cells
Application Note for Leica EM TIC020, Leica EM TIC 3X - Cross section of a complete solar cell.
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD
Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Ni/Cu on Steel for EBSD
Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Painted Concrete
Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cuts of material combinations consisting of hard and soft materials. Here, cross sectioning of painted…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of a Superconductive Wire
Application Note for Leica EM TIC 3X - Purpose: The shape of the wire is difficult for ion beam slope cutting. Goal: Cross sectional preparation to see the structure of the wire.
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Science Lab Topic:
EM Sample Preparation
Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)
Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Alumina
Application Note for Leica EM TIC 3X - Alumina is very difficult to handle and almost impossible to prepare with conventional methods. Ion beam slope cutting is a method that can achieve cross…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of CuSn Connector of a Solar Cell
Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cross sections of soft materials or material combinations consisting of hard and soft components. The…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Oil Shale Rock
Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently…
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Rubber (Tire)
Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components.
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Science Lab Topic:
EM Sample Preparation
Cross Sectioning of Basalt Fibres
Application Note for Leica EM TIC 3X - Material Research. Purpose: The fibres are embedded in a soft matrix. That makes it difficult to prepare a cross section. Goal:
Cross section of the basalt…
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Science Lab Topic:
EM Sample Preparation
Triple-beam Ar-Ion-Milling with a Rotary Stage to Decorate Grain Boundaries and Substructures in Rock Salt
Decoration of grain boundaries in polycrystalline rocks has a long tradition in Structural Geology as in a monomineralic rock the recrystallized grain size is a good indicator for the paleostress…
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Science Lab Topic:
EM Sample Preparation
Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”
In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica…
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Science Lab Topic:
EM Sample Preparation
A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples
In June 2014, the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris became a Leica reference lab for EM Sample Preparation…
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Science Lab Topic:
EM Sample Preparation
High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling
Electron Backscatter Diffraction technique (EBSD) is known as a
"surface" technique because electron diffraction is generated
within a few tens of nanometers of the sample surface. Therefore,
the…
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Science Lab Topic:
EM Sample Preparation
Partner Lab for EM Sample Preparation in Paris
At the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris an new lab for EM Sample Preparation welcomes researchers of…
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Science Lab Topic:
EM Sample Preparation
Analysis of Oil Shale as an Alternative Source of Energy
For some years now, the search for alternative sources of raw materials has concentrated on oil shale deposits. As the exploitation of these raw materials is still extremely complex and expensive,…
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Science Lab Topic:
EM Sample Preparation
Triple Ion Beam Cutting of Diamond/Al Composites for Interface Characterization
The microstructure of new materials with heterogenic components is extremely difficult to study. As mechanical polishing often not leads to smooth surfaces, a novel ion beam cutting technique has…
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Science Lab Topic:
EM Sample Preparation
A Word on Cathodoluminescence
Cathodoluminescence microanalysis is an emerging technique that is fast gaining popularity in the world of materials science. CL is a light emission phenomena resulting from the electron beam…
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Science Lab Topic:
EM Sample Preparation
University of Wollongong Electron Microscopy Centre
The University of Wollongong has a diverse range of materials research programs that includes metallurgy for mining, manufacturing, steel making and transport; polymers for solar cells, energy storage…
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