Leica EM TXP Ion Beam Milling 電顕用試料作製装置 製品紹介 Home Leica Microsystems

Learn more about the Leica EM TXP Target surfacing System

The Leica EM TXP is a unique target preparation device especially developed for cutting, milling, drilling, grinding and polishing samples prior to examination by SEM, TEM and LM techniques.