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DM6 M LIBS 微細構造の化学分析のためのソリューション

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Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany.

Microscopic Defects in Electroplating

This free on-demand webinar shows how to identify quickly root causes of defects during electroplating of components with optical microscopy and LIBS (laser spectroscopy).
User analyzing particles and fibers on a filter for cleanliness analysis with the DM6 M LIBS 2-methods-in-1 solution.

Basics in Component Cleanliness Analysis

An overview on the basics of component cleanliness and analysis solutions that can be tailored to your specific needs is presented. For the automotive industry, obtaining results rapidly, accurately,…

Cleanliness Analysis with a 2-Methods-in-1 Solution

In this article, it is examined how an overall efficient and cost-effective cleanliness analysis workflow can be achieved with a 2-methods-in-1 materials analysis solution, combining optical…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Particles and fibers on a filter which will be counted and analyzed for cleanliness

Efficient Particle Counting and Analysis

This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
A stack of lithium-ion batteries

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
When particulate contamination is present in lubricating fluids or oils, it can cause damage to parts or components leading to malfunctions.

Hydraulics in the Automotive and Aerospace Industries

Cleanliness standards relating to lubricants, hydraulic fluids, and oils, e.g., ISO 4406 and DIN 51455 are discussed in this article. Cleanliness plays a central role in the automotive and…
Particles which could be found during cleanliness analysis of parts and components.

Cleanliness of Automotive Components and Parts

This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
Multiple particles seen on a filter imaged with a microscope

Improving the Cleanliness Analysis Workflow

For automotive manufacturers and automotive component suppliers, obtaining cleanliness results rapidly, accurately, and reliably over the entire workflow is a significant advantage. Often for this…
Particle analysis with LIBS using the DM6 M LIBS 2-in-1 solution: Particle of brass, an alloy of copper (Cu) and zinc (Zn).

High Speed for Your Material Analysis Workflow

Learn from our expert, Dr. Konstantin Kartaschew, how the intelligent combination of light microscopy with laser-induced breakdown spectroscopy (LIBS) will truly accelerate your root-cause-analysis…

Microstructural Characterization including Compositional Analysis

Leica Microsystems' versatile upright compound microscope, DM6 M, fitted with Laser-Induced Breakdown Spectroscopy module will let you not only analyze metallographically polished samples and conduct…

Keeping Particulate Contamination Under Control in Pharmaceutical Products

This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…

Fast Visual and Chemical Analysis of Contamination and Underlying Layers

Visual and chemical analysis of contamination on materials with a 2-methods-in-1 solution leading to an efficient, more complete analysis workflow is described in this report. A 2-in-1 solution,…

Depth Profiling and Layer Analysis for Inspection of Materials with a 2-In-1 Solution Combining Optical Microscopy and Laser Spectroscopy

In addition to simultaneous visual and chemical inspection, a 2-methods-in-1 materials analysis solution, which combines optical microscopy and laser induced breakdown spectroscopy (LIBS), can also be…
Printed Circuit Board (PCB)

Performing Elemental Analysis down to the Micro Scale

If you work in electronic component analysis, you will be familiar with the many challenges posed. Whether you are identifying metallic particles or checking product authenticity, it’s important to…

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

Simplify and Speed Up Element Analysis at the Micron Range

Learn how to get spatially resolved information about the chemical composition of elements in seconds - quickly and easily.

See the Structure with Microscopy - Know the Composition with Laser Spectroscopy

The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…
バッテリー製造向け顕微鏡ソリューション

バッテリー製造

バッテリー製造には、検査に関するいくつかの主な課題があります。サンプル前処理と顕微鏡による外観検査および拡張分析用のソリューションが必要です。

応用分野

金属組織学

ライカの金属顕微鏡は、金属、合金、その他の材料の微細構造解析のために最適化されています。

自動車&輸送機器業界

ライカのインテリジェントなイメージングソリューションは、現在および将来のニーズに対応し、お客様は技術革新に集中することができます。

材料と地球科学

信頼性が高く、高品質なイメージングと解析を行なうためには、適切なツールが必要です。顕微鏡のライカは、 幅広い光学機器、イメージングシステム、ソフトウェア、人間工学に基づいたアクセサリで、お客様のニーズに合った最適なソリューションを提供致します。

清浄度評価

製品の機能と耐用期間は、粒子のコンタミネーションと関係し、粒子のコンタミネーションを定量的に検出することは、製造工程の改善につながります。

工業用光学顕微鏡

材料解析には、金属合金、半導体、ガラス、セラミック、プラスチック、ポリマーなど、さまざまな材料の画像処理、測定、分析のための顕微鏡ソリューションが必要です。

工業用顕微鏡のマーケット

稼働時間を最大化し、生産性向上により、お客様の収益に貢献します。ライカの顕微鏡(マイクロスコープ)ソリューションは、微細な異物や残渣なども見逃しなく、迅速かつ信頼性の高い分析、文書化、結果報告を実現します。ライカマイクロシステムズは、幅広いソリューションとエキスパートによるサポートを提供し、さまざまなアプリケーションのニーズにお応えします。

鉄鋼・金属・鉱業業界

ライカの金属組織観察・分析ソリューションは、正確さと手軽さ、そしてスピード向上に寄与します

エレクトロニクスのための断面解析

電子・エレクトロニクス業界では、断面解析により、プリント基板(PCB)、アセンブリ(PCBA)、集積回路(IC)などのコンポーネントの故障メカニズムを詳細に解析します。

エレクトロニクスおよび半導体産業

電子機器や半導体にとって、PCB、ウェハー、ICチップ、バッテリーの効率的な検査、断面解析、清浄度分析、研究開発を可能にするソリューションは極めて重要です。

バッテリー製造

バッテリー製造には、検査に関するいくつかの主な課題があります。サンプル前処理と顕微鏡による外観検査および拡張分析用のソリューションが必要です。
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