EM TXP 断面試料作製装置

電子顕微鏡および光学顕微鏡による検査に向けた断面試料作製の出発点となる装置です。

Learn more about the Leica EM TXP Target surfacing System

The Leica EM TXP is a unique target preparation device especially developed for cutting, milling, drilling, grinding and polishing samples prior to examination by SEM, TEM and LM techniques.

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