EM TXP
電顕用試料作製装置
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EM TXP 断面試料作製装置
電子顕微鏡および光学顕微鏡による検査に向けた断面試料作製の出発点となる装置です。
Learn more about the Leica EM TXP Target surfacing System
The Leica EM TXP is a unique target preparation device especially developed for cutting, milling, drilling, grinding and polishing samples prior to examination by SEM, TEM and LM techniques.