Especialidades médicas | Aprenda e compartilhe | Leica Microsystems

Especialidades médicas

Especialidades médicas

Explore uma coleção abrangente de recursos científicos e clínicos adaptados para profissionais de saúde, incluindo percepções de colegas, estudos de casos clínicos e simpósios. Projetado para neurocirurgiões, oftalmologistas e especialistas em cirurgia plástica e reconstrutiva, otorrinolaringologia e odontologia. Esta coleção destaca os mais recentes avanços em microscopia cirúrgica. Descubra como as tecnologias cirúrgicas de ponta, como fluorescência AR, visualização 3D e imagens intraoperatórias de OCT, possibilitam a tomada de decisões confiantes e a precisão em cirurgias complexas.

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Camera image during auto alignment. The feedback lines indicate if the correct edges in the image are detected. Green: Vertical center line; Magenta: Upper edge of the light gap; White: Lower edge of the light gap (not visible here, falling together with red line); Red: Knife edge; Blue: Left and right edge of the block face being automatically detected.

Automatic Alignment of Sample and Knife for High Sectioning Quality

Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.

Section ribbons with increasing section thickness - silver to purple ending in blue sections.

High Quality Sectioning in Ultramicrotomy

Discover the significance of achieving high-quality uniform sections with ultramicrotomy for precise imaging in electron microscopy.

Preparation of an IC-chip cross section require cutting of the chip followed by grinding and polishing of the cross section.

Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries

Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…

Image of immunofluorescently labelled cells where mitochondria are indicated with red, nuclei with blue, and actin with green.

Studying Virus Replication with Fluorescence Microscopy

The results from research on SARS-CoV-2 virus replication kinetics, adaption capabilities, and cytopathology in Vero E6 cells, done with the help of fluorescence microscopy, are described in this…

Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…

Acrylonitrile butadiene styrene (ABS) stained with osmium tetroxide (OsO4), sectioned with a DIATOME diamond knife at room temperature, and then imaged with HAADF TEM.

Ultramicrotomy Techniques for Materials Sectioning

Learn about ultramicrotomy for materials sectioning when investigating polymers and brittle materials with transmission (TEM) or scanning electron microscopy (SEM) or atomic force microscopy.

Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…

EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.