Leica DM4 M & DM6 M 正立金属顕微鏡



Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
Neurons imaged with DIC contrast.

Differential Interference Contrast (DIC) Microscopy

This article demonstrates how differential interference contrast (DIC) can be actually better than brightfield illumination when using microscopy to image unstained biological specimens.
User analyzing particles and fibers on a filter for cleanliness analysis with the DM6 M LIBS 2-methods-in-1 solution.

Basics in Component Cleanliness Analysis

An overview on the basics of component cleanliness and analysis solutions that can be tailored to your specific needs is presented. For the automotive industry, obtaining results rapidly, accurately,…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Particles and fibers on a filter which will be counted and analyzed for cleanliness

Efficient Particle Counting and Analysis

This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
A stack of lithium-ion batteries

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
Particles which could be found during cleanliness analysis of parts and components.

Cleanliness of Automotive Components and Parts

This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
Multiple particles seen on a filter imaged with a microscope

Improving the Cleanliness Analysis Workflow

For automotive manufacturers and automotive component suppliers, obtaining cleanliness results rapidly, accurately, and reliably over the entire workflow is a significant advantage. Often for this…
Sport Fabrics Taped I3 10x Color

How Industrial Applications Benefit from Fluorescence Microscopy

Watch this free webinar to know more about what you can do with fluorescence microscopy for industrial applications. We will cover a wide range of investigations where fluorescence contrast offers new…

Challenges Faced When Manually Rating Non-Metallic Inclusions (NMIs) to Determine Steel Quality

Rapid, accurate, and reliable rating of non-metallic inclusions (NMIs) is instrumental for the determination of steel quality. This article describes the challenges that arise from manual NMI rating,…

Reasons Why There is Growing Need for Fast and Reliable Steel Quality Rating Solutions

Steel quality is critical for the manufacturing of high-quality components and products. Fast, reliable, and accurate detection and classification of inclusions has become essential for both component…

Inverted Microscopes for Grain Size Analysis: Three Factors to Consider

Microscopic steel grain size analysis is useful in determining the quality of steel alloys for a given purpose such as building bridges vs railroad rails. This webinar will describe the preparation of…

Top Issues Related to Standards for Rating Non-Metallic Inclusions in Steel

Supplying components and products made of steel to users worldwide can require that a single batch be compliant with multiple steel quality standards. This user demand creates significant challenges…

Rate the Quality of Your Steel: Free Webinar and Report

This webinar and report describe optimal microscopy solutions for rating steel quality in terms of non-metallic inclusions and reviews the various international and regional standards concerning…

Metallography – an Introduction

This article gives an overview of metallography and metallic alloy characterization. Different microscopy techniques are used to study the alloy microstructure, i.e., microscale structure of grains,…
Measuring grains size with Abrams Three-Circle Procedure.

How to Adapt Grain Size Analysis of Metallic Alloys to Your Needs

Metallic alloys, such as steel and aluminum, have an important role in a variety of industries, including automotive and transportation. In this report, the importance of grain size analysis for alloy…
Extended Depth of Focus (EDOF) images

How To Create EDOF (Extended Depth of Focus) Images

Watch this video to see how you can rapidly record sharp optical microscope images of samples with a large height variation. This is done with the optional Extended Depth of Focus (EDOF) function of…

See the Structure with Microscopy - Know the Composition with Laser Spectroscopy

The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…









非金属介在物の評価の効率が向上し 、鋼の品質を短時間で検証できるため、信頼性の高い性能と長寿命を実現できます。 工業規格や鉄鋼規格がより厳格化し、国際、各国、組織の各規格に準拠した非金属介在物の厳格な評価が必要になっています。


確実に証拠を集める必要がある法科学者には、正確で高品質、精密で再現性の高い顕微鏡とイメージングシステムが必要です。 ライカマイクロシステムズは、測定・分析・結果の文書化に必要な、ルーチン機器から、フルオートの高性能機器まで全てサポートしています。












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