Leica EM AC20
Elektronenmikroskopie Probenvorbereitung
Produkte
Startseite
Leica Microsystems
Leica EM AC20 Automatisches Kontrastierungsinstrument für ultradünne Schnitte
Lesen Sie unsere neuesten Artikel
Brief Introduction to Contrasting for EM Sample Preparation
Since the contrast in the electron microscope depends primarily on the differences in the electron density of the organic molecules in the cell, the efficiency of a stain is determined by the atomic…
Perusing Alternatives for Automated Staining of TEM Thin Sections
Contrast in transmission electron microscopy (TEM) is mainly produced by electron scattering at the specimen: Structures that strongly scatter electrons are referred to as electron dense and appear as…
Möchten Sie mehr erfahren?
Sprechen Sie mit unseren Experten.
Wünschen Sie eine persönliche Beratung? Show local contacts