Leica EM RES102 Ionenstrahl-Ätzsystem
SEM
Sample Holder for the cleaning, polishing and contrast enhancement of SEM and LM samples at environment temperature or with LN2 cooling. The SEM holder allows to prepare a sample size up to 25mm…
SEM
Slope Cutter Holder for the production of cross-sectional (90°) and angled sections (35°) for SEM investigation of vertical structures sample. Specimens can be prepared at environment temperature or…
SEM
SEM clamp holder to hold small samples with maximum dimensions of 5 (H) x 7 (W) x 2 (D) mm. This holder can be easily transferred directly to the SEM without removing the sample.
TEM
Sample Holder (Quick Clamp Holder) for single and double-sided low angle milling down to 4°.
TEM
Cooling Holder for the preparation of temperature-sensitive samples in combination with the LN2 cooling device.
FIB
Cleaning holder used to reduce the amorphizised layer of a FIB sample.
