Ionenstrahl-Ätzsystem Leica EM RES102

Ionenstrahl-Ätzsystem Leica EM RES102

Archiviertes Produkt
This item has been phased out and is no longer available. Please contact us using the button below to enquire about recent alternative products that may suit your needs.

SEM

Sample Holder for the cleaning, polishing and contrast enhancement of SEM and LM samples at environment temperature or with LN2 cooling. The SEM holder allows to prepare a sample size up to 25mm…

SEM

Slope Cutter Holder for the production of cross-sectional (90°) and angled sections (35°) for SEM investigation of vertical structures sample. Specimens can be prepared at environment temperature or…

SEM

SEM clamp holder to hold small samples with maximum dimensions of 5 (H) x 7 (W) x 2 (D) mm. This holder can be easily transferred directly to the SEM without removing the sample.

TEM

Sample Holder (Quick Clamp Holder) for single and double-sided low angle milling down to 4°.

TEM

Cooling Holder for the preparation of temperature-sensitive samples in combination with the LN2 cooling device.

FIB

Cleaning holder used to reduce the amorphizised layer of a FIB sample.
Scroll to top