James M. Marr , Ph.D.
James ist seit 2019 bei Leica Microsystems als Advanced-Workflow-Spezialist für die Widefield-Produktlinie von Leica tätig. Während seiner Zeit am National Institute of Standards and Technology (NIST) nutzte James die fortschrittliche Mikroskopie, um robuste Anwendungen zu entwickeln und einzusetzen, darunter: automatisierte Partikelidentifizierung und -extraktion, Widefield-Lebensdauermessungen und superauflösende Einzelmolekül-Bildgebung.
Studying Wound Healing of Smooth Muscle Cells
This article discusses how wound healing of cultured smooth muscle cells (SMCs) in multiwell plates can be reliably studied over time with less effort using a specially configured Leica inverted…
The Power of Pairing Adaptive Deconvolution with Computational Clearing
Learn how deconvolution allows you to overcome losses in image resolution and contrast in widefield fluorescence microscopy due to the wave nature of light and the diffraction of light by optical…
An Introduction to Computational Clearing
Many software packages include background subtraction algorithms to enhance the contrast of features in the image by reducing background noise. The most common methods used to remove background noise…