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DM6 M LIBS Lösung zur Analyse der Zusammensetzung von Mikrostrukturen

2-in-1 Lösung für visuelle und chemische Materialinspektion mit 90 % Zeitersparnis

Lesen Sie unsere neuesten Artikel

Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany.

Microscopic Defects in Electroplating

This free on-demand webinar shows how to identify quickly root causes of defects during electroplating of components with optical microscopy and LIBS (laser spectroscopy).
User analyzing particles and fibers on a filter for cleanliness analysis with the DM6 M LIBS 2-methods-in-1 solution.

Basics in Component Cleanliness Analysis

An overview on the basics of component cleanliness and analysis solutions that can be tailored to your specific needs is presented. For the automotive industry, obtaining results rapidly, accurately,…

Cleanliness Analysis with a 2-Methods-in-1 Solution

In this article, it is examined how an overall efficient and cost-effective cleanliness analysis workflow can be achieved with a 2-methods-in-1 materials analysis solution, combining optical…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
[Translate to German:] Particles and fibers on a filter which will be counted and analyzed for cleanliness

Effiziente Partikelzählung und -analyse

Dieser Bericht befasst sich mit der Partikelzählung und -analyse unter Verwendung der optischen Mikroskopie bei der technischen Sauberkeitsanalyse von Teilen und Komponenten. Die Partikelzählung und…
A stack of lithium-ion batteries

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
When particulate contamination is present in lubricating fluids or oils, it can cause damage to parts or components leading to malfunctions.

Hydraulics in the Automotive and Aerospace Industries

Cleanliness standards relating to lubricants, hydraulic fluids, and oils, e.g., ISO 4406 and DIN 51455 are discussed in this article. Cleanliness plays a central role in the automotive and…
[Translate to German:] Particles which could be found during cleanliness analysis of parts and components.

Technische Sauberkeit von Automobilkomponenten und -teilen

In diesem Artikel werden die ISO-Norm 16232 und die VDA 19-Richtlinien erläutert und die Verfahren zur Partikelanalyse kurz zusammengefasst. Diese liefern wichtige Kriterien für die Sauberkeit von…
Multiple particles seen on a filter imaged with a microscope

Improving the Cleanliness Analysis Workflow

For automotive manufacturers and automotive component suppliers, obtaining cleanliness results rapidly, accurately, and reliably over the entire workflow is a significant advantage. Often for this…
Particle analysis with LIBS using the DM6 M LIBS 2-in-1 solution: Particle of brass, an alloy of copper (Cu) and zinc (Zn).

High Speed for Your Material Analysis Workflow

Learn from our expert, Dr. Konstantin Kartaschew, how the intelligent combination of light microscopy with laser-induced breakdown spectroscopy (LIBS) will truly accelerate your root-cause-analysis…

Microstructural Characterization including Compositional Analysis

Leica Microsystems' versatile upright compound microscope, DM6 M, fitted with Laser-Induced Breakdown Spectroscopy module will let you not only analyze metallographically polished samples and conduct…

Keeping Particulate Contamination Under Control in Pharmaceutical Products

This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…

Fast Visual and Chemical Analysis of Contamination and Underlying Layers

Visual and chemical analysis of contamination on materials with a 2-methods-in-1 solution leading to an efficient, more complete analysis workflow is described in this report. A 2-in-1 solution,…

Depth Profiling and Layer Analysis for Inspection of Materials with a 2-In-1 Solution Combining Optical Microscopy and Laser Spectroscopy

In addition to simultaneous visual and chemical inspection, a 2-methods-in-1 materials analysis solution, which combines optical microscopy and laser induced breakdown spectroscopy (LIBS), can also be…
Printed Circuit Board (PCB)

Performing Elemental Analysis down to the Micro Scale

If you work in electronic component analysis, you will be familiar with the many challenges posed. Whether you are identifying metallic particles or checking product authenticity, it’s important to…

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

Simplify and Speed Up Element Analysis at the Micron Range

Learn how to get spatially resolved information about the chemical composition of elements in seconds - quickly and easily.

See the Structure with Microscopy - Know the Composition with Laser Spectroscopy

The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…
Microscopy Solutions for Battery Manufacturing

Battery Manufacturing

Battery manufacturing has several key challenges concerning inspection. Solutions for sample preparation and microscopic visual and chemical analysis are needed.

Anwendungsbereiche

Metallographie

Metallographische Mikroskope von Leica sind für die Mikrostrukturanalyse von Metallen, Legierungen und sonstigen Materialien optimiert.

Automobilindustrie und Transport Industriemikroskope

Leica ist Ihr zuverlässiger Partner für Bildgebungslösungen, die Ihnen zu einem Wettbewerbsvorteil verhelfen können. Mit unseren intelligenten Mikroskopsystemen können Sie sich voll darauf…

Material- & Geowissenschaften

Sie benötigen die richtigen Werkzeuge für eine zuverlässige und qualitativ hochwertige Bildgebung und Analyse. Leica Microsystems bietet Ihnen alles aus einer Hand. Zusammen mit kompetenter…

Technische Sauberkeit

For industrial and electronics manufacturers as well as non-regulated pharma applications, solutions for an efficient technical cleanliness offer significant advantages.

Mikroskope für Materialanalysen

Die Materialanalyse erfordert Mikroskoplösungen für die Bildgebung, Messung und Analyse von Merkmalen in einer Vielzahl von Materialien wie Metalllegierungen, Halbleitern, Glas und Keramik sowie…

Märkte für industrielle Mikroskopie

Maximale Betriebszeit und effizientes Erreichen von Zielen helfen Ihnen, Ihr Ergebnis zu verbessern. Mit den Mikroskoplösungen von Leica Microsystems erhalten Sie Einblicke in kleinste Probendetails…

Metallindustrie

Leica Mikroskop-Lösungen für die Metallindustrie sind nützliche Werkzeuge, um die Qualität von Werkstoffen zu beurteilen und die Einhaltung relevanter Normen sicherzustellen.

Querschnittsanalyse in der Elektronik

Die Querschnittsanalyse für die Elektronik ermöglicht eine detaillierte Analyse der Mechanismen von Fehlern bei Komponenten wie Leiterplatten (PCBs), Baugruppen (PCBAs) und integrierten Schaltkreisen…

Elektronik- und Halbleiterindustrie

Für die Elektronik- und Halbleiterindustrie sind Lösungen für eine effiziente Inspektion, Querschnitts- und Sauberkeitsanalyse sowie für die Forschung und Entwicklung von PCBs, Wafern, IC-Chips und…
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