Sciences de la vie

Sciences de la vie

Sciences de la vie

C'est ici que vous pourrez développer vos connaissances, vos capacités de recherche et les applications pratiques de la microscopie dans divers domaines scientifiques. Apprenez à obtenir une visualisation précise, à interpréter les images et à faire progresser la recherche. Trouvez des informations pertinentes sur la microscopie avancée, les techniques d'imagerie, la préparation des échantillons et l'analyse des images. Les sujets abordés comprennent la biologie cellulaire, les neurosciences et la recherche sur le cancer, en mettant l'accent sur les applications et les innovations de pointe.
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
SEM image of the full Li-NMC electrode sample, showing the two porous layers and the metal film at the center of the structure.

Cross Section Ion Beam Milling of Battery Components

Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…

Ion Beam Milling Guide: Enhancing Surface Quality for High-Resolution Imaging and Analysis

In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…

Studying the Microstructure of Natural Polymers in Fine Detail

The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…

Practical Applications of Broad Ion Beam Milling

Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…

Each Atom Counts: Protect Your Samples Prior to FIB Processing

Application Note for Leica EM ACE600 - Focused ion beam (FIB) technology has become an indispensable tool for site-specific TEM sample preparation. It allows to extract electron transparent specimens…
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