Contact & Support

Download this 76-pages booklet today and learn how to improve your processes

In this booklet you can find information about how ion beam milling can help you to:

  • Generate cross sectional sample preparation for different materials (semiconductor, metal, stones, paper/wood materials and thermally sensitive samples) 
  • Clean sample surfaces and set contrast enhancement 
  • Process large sample surfaces 
  • Prepare samples for EBSD

Get the Booklet

*
*
*
*
*
*
*
*
I hereby give Leica Microsystems and their affiliates permission to provide me with information about their products and services. I understand that I may be contacted by phone, SMS or email.
*
By clicking on the SUBMIT button, I confirm that I have reviewed and agree with Leica Microsystems Terms of Use and their Privacy Policy. I also understand my privacy choices as they pertain to my personal data, as detailed in the aforementioned Privacy Policy under ‘’Your Privacy Choices’’.