Download this 76-pages booklet today and learn how to improve your processes.
In this booklet you can find information about how ion beam milling can help you to:
- Generate cross sectional sample preparation for different materials (semiconductor, metal, stones, paper/wood materials and thermally sensitive samples)
- Clean sample surfaces and set contrast enhancement
- Process large sample surfaces
- Prepare samples for EBSD
Related Articles
-
The “Waffle Method”: High-Pressure Freeze Complex Samples
This article describes the advantages of a special high pressure freezing method, the so-called…
Jul 08, 2025Read article -
Mastering Polymer Sectioning with Helmut Gnaegi
When it comes to ultramicrotomy, few names carry the weight of Helmut Gnaegi. As co-founder of…
Jul 04, 2025Read article -
How Fluorescence Guides Sectioning of Resin-embedded EM Samples
Electron microscopes, including transmission electron microscopes (TEM) and scanning electron…
Jun 03, 2025Read article
Related Pages
-
Electron Microscope Sample Preparation
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared –…
Visit related page
