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Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy
The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
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Safe Wafer Loading for Microscope Inspection without Hand Contact
How automated silicon wafer loading for microscope inspection helps improve microelectronics process control and production efficiency is explained in this article. Manual handling of wafers has a…
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Keeping Particulate Contamination Under Control in Pharmaceutical Products
This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…