DM3 XL Upright Microscopes Light Microscopes Products Home Leica Leica Microsystems

Fast detection, fast action

The Inspection System for Microelectronics and Semiconductor DM3 XL

  • Semiconductor Wafer Processing, IC Packaging & Testing

    Leica Microsystems’ customized, modular imaging solutions help suppliers and device manufacturers achieve fast and precise inspection and analysis for wafer processing, IC packaging, IC assembly, and…
    Read article
  • Wafer
    Science Lab Topic: Quality Assurance

    How to Boost your Microelectronic Component Inspection Performance

    Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…
    Read article