DM3 XL Upright Light Microscopes Products Home Leica Microsystems

For Microelectronics and Semiconductor

Inspection System DM3 XL

Archived Product
This item has been phased out. Please contact your sales person with possible substitutions.

Speed matters in inspection, process control, or defect and failure analysis for the microelectronics and semiconductor industry. The faster you detect a defect, the faster you can react.

With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective.