Frédéric Leroux , PhD

Frédéric Leroux

Frédéric Leroux completed his Master degree in Biology in 2007 at the University of Ghent where he gained experience in biological EM sample preparation. In 2008, he moved to the physics department at the University of Antwerp where he started his PhD. At the EMAT research group he specialized in advanced electron microscopy of composite materials. 2016, he joined Leica Microsystems as Application Specialist Nanotechnology EMEA.

He received his PhD in 2012. After 2 years as a postdoctoral researcher he became EM sample preparation specialist at EMAT. He thereby uses his multidisciplinary background and broad microscopy experience to improve EM sample preparation of a variety of materials (polymers, composites, biological and industrial materials).

Exploring the Structure and Life Cycle of Viruses

The SARS-CoV-2 outbreak started in late December 2019 and has since reached a global pandemic, leading to a worldwide battle against COVID-19. The ever-evolving electron microscopy methods offer a…

Workflows and Instrumentation for Cryo-electron Microscopy

Cryo-electron microscopy is an increasingly popular modality to study the structures of macromolecular complexes and has enabled numerous new insights in cell biology. In recent years, cryo-electron…

Bridging Structure and Dynamics at the Nanoscale through Optogenetics and Electrical Stimulation

Nanoscale ultrastructural information is typically obtained by means of static imaging of a fixed and processed specimen. However, this is only a snapshot of one moment within a dynamic system in…

Expanding the Limits of Electron Microscopy Sample Preparation

Capturing the intricate changes in fine structure or in cell dynamics with conventional cryo solutions can be challenging sometimes. Leica Microsystems has developed a new cryo platform, the Leica EM…

Carbon Coating for Polymeric Materials

Application Note fo Leica EM ACE600 - A solid understanding of polymer property-structure relationships is critical to improve and shorten development routes to new products. A direct way to determine…

Each Atom Counts: Protect Your Samples Prior to FIB Processing

Application Note for Leica EM ACE600 - Focused ion beam (FIB) technology has become an indispensable tool for site-specific TEM sample preparation. It allows to extract electron transparent specimens…

Ultra-thin Carbon Support Films for Improved STEM-EELS Analysis of Nanoparticles

Application Note for Leica EM ACE600 - Recent developments in aberration corrected transmission electron microscopes as well as further improvements in monochromaters and spectrometers have pushed the…

Ways to Reveal More from your Samples: Ultra-Thin Carbon Films

Application Note for Leica EM ACE600 - Much of the battle involved in obtaining good transmission electron microscopy data is in the specimen preparation itself. Even though some nanomaterials are…

Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica…
Scroll to top