Contact Us

Application Booklet for EM TIC 3X

Today, ion beam milling is one of the most widely-used methods for preparing samples for electron microscopy.

Product image EM TIC 3X Leica-EM-TIC3x-IonBeam-Milling.jpg

During this process, the sample material is bombarded with a high-energy argon-ion beam to achieve high quality cross-sections and planed surfaces whilst minimizing deformation or damage. One can clean, polish or adjust the contrast of these surfaces to optimise them for subsequent imaging in the scanning electron microscope. The booklet is available in English or in German.

Download this 76-pages booklet today and learn how to improve your processes. 

In this booklet you can find information about how ion beam milling can help you to:

  • Generate cross sectional sample preparation for different materials (semiconductor, metal, stones, paper/wood materials and thermally sensitive samples) 
  • Clean sample surfaces and set contrast enhancement 
  • Process large sample surfaces 
  • Prepare samples for EBSD

Get the Booklet

By clicking on the SUBMIT button, I confirm that I have reviewed and agree with Leica Microsystems GmbH Terms of Use and their Privacy Policy. I also understand my privacy choices as they pertain to my personal data, as detailed in the aforementioned Privacy Policy under ‘’Your Privacy Choices’’.

Related Articles

Related Pages

Background image

Interested to know more?
Talk to our experts.

Price

I need a configuration or price info.

Service & Support

I need technical support, service contract or software info.

Demo

I need an on site or remote demo.

Application

I need assistance/training to operate my system.

Do you prefer personal consulting? Show local contacts

Scroll to top