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James DeRose , Ph.D.

James DeRose

James DeRose ist wissenschaftlicher und technischer Redakteur für Stereo- und Digitalmikroskopie bei Leica Microsystems. Er verfügt über mehr als 20 Jahre Erfahrung im wissenschaftlichen und technischen Schreiben für Buch- und Zeitschriftenpublikationen. Er ist Mitautor von mehr als 35 wissenschaftlichen und technischen Publikationen, die in internationalen Fachzeitschriften veröffentlicht wurden, von mehr als 45 Präsentationen für internationale wissenschaftliche Konferenzen und Symposien sowie von zwei Patentanmeldungen. Er ist Hauptherausgeber des Buches "Aluminium Alloy Corrosion of Aircraft Structures: Modelling and Simulation", das im Jahr 2012 veröffentlicht wurde. Dieses Buch ist aus dem von der EU im 6. Rahmenprogramm finanzierten Projekt SICOM hervorgegangen. Er hat wissenschaftliche und technische Projekte mit Schwerpunkt auf angewandter F&E und Anwendungsentwicklung in den Bereichen Grenzflächenchemie und -physik, thermische und chemische Verfahrenstechnik, Korrosion und Metallografie, Oberflächenbeschichtungen und -analyse, Materialwissenschaft, Biotechnologie und Zellbiologie geleitet und zu diesen beigetragen. Er verfügt über Erfahrung mit verschiedenen Arten von Mikroskopie- und Analysemethoden. In der Vergangenheit hat er am California Institute of Technology, an der Eidgenössischen Technischen Hochschule in Lausanne sowie bei der Firma Cytion (Molecular Devices) an Projekten der angewandten Forschung und Entwicklung sowie der Anwendungsentwicklung gearbeitet. James promovierte 1993 an der Arizona State University in Physik mit dem Schwerpunkt angewandte Forschung in den Bereichen Oberflächenwissenschaften, physikalische Chemie und Biophysik. Er arbeitet seit August 2013 bei Leica Microsystems.

Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
THUNDER image of brain-capillary endothelial-like cells derived from human iPSCs (induced pluripotent stem cells) where cyan indicates nuclei and magenta tight junctions.

Rapid Check of Live Stem Cells in Cell-Culture Inserts set in Multi-Well Plates

See how efficient imaging of live iPSC stem cells within cell-culture inserts set in a multi-well plate can be done to evaluate the cells using a THUNDER Imager. Just read this article.
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Microscope equipped with a K7 color CMOS camera for life-science and industry imaging applications.

Technical Terms for Digital Microscope Cameras and Image Analysis

Learn more about the basic principles behind digital microscope camera technologies, how digital cameras work, and take advantage of a reference list of technical terms from this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.

Erforschung der Virusreplikaton mit Fluoreszenzmikroskopie

Viren können mit Hilfe verschiedener Mikroskopietechniken untersucht werden. Je nach Vergrößerung und Auflösung des Mikroskops kann die Beobachtung auf Gewebe-, Zell- oder Virionenebene erfolgen.
Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
Fluorescence microscopy image of liver tissue where DNA in the nuclei are stained with Feulgen-pararosanilin and visualized with transmitted green light.

Epi-Illumination Fluorescence and Reflection-Contrast Microscopy

This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
Image of an onion flake taken with a basic Leica compound microscope after it was tested for resistance to fungus and mold growth following part 11 of the ISO 9022 standard.

ISO 9022 Standard Part 11 - Testing Microscopes with Severe Conditions

This article describes a test to determine the robustness of Leica microscopes to mold and fungus growth. The test follows the specifications of the ISO 9022 part 11 standard for optical instruments.
EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
[Translate to German:] Stereo microscopes are often considered the workhorses of laboratories and production sites.

Wichtige Faktoren, die Sie bei der Auswahl eines Stereomikroskops berücksichtigen sollten

Stereomikroskope zeichnen sich durch ihre Fähigkeit aus, einen 3D-Eindruck der Probe zu erzeugen. Daher eignen sie sich besonders gut für Inspektion und Nacharbeit, Qualitätskontrolle, Forschung und…
Geringe Vergrößerung DVM6-Bild eines Teils der PCBA-Probe.

Schnelle und zuverlässige Untersuchung von Leiterplatten und Leiterplattenbaugruppen mittels Digitalmikroskopie

Digitalmikroskope bieten Anwendern eine bequeme und schnelle Möglichkeit zur Erfassung hochwertiger, zuverlässiger Bilddaten und zur schnellen Inspektion und Analyse von Leiterplatten (PCBs) und…
Raw widefield and THUNDER image of calcium transients in Drosophila embryos. Courtesy A. Carreira-Rosario, Clandinin laboratory, California, USA.

Central Nervous System (CNS) Development and Activity in Organisms

This article shows how studying central nervous system (CNS) development in Drosophila-melanogaster embryos expressing a GCaMP calcium indicator in the neurons can be improved with a THUNDER Imager.
Patch pipette touching a murine hippocampal neuron. Image courtesy of A. Aguado, Ruhr University Bochum, Germany.

What is the Patch-Clamp Technique?

This article gives an introduction to the patch-clamp technique and how it is used to study the physiology of ion channels for neuroscience and other life-science fields.
Neurons imaged with DIC contrast.

Differential Interference Contrast (DIC) Microscopy

This article demonstrates how differential interference contrast (DIC) can be actually better than brightfield illumination when using microscopy to image unstained biological specimens.
The Emspira 3 digital microscope offers what users need for comprehensive visual inspection, including comparison, measurement, and documentation sharing.

Digital Inspection Microscope for Industrial Applications

Factors users should consider before choosing a digital inspection microscope for industrial applications, including quality control (QC), failure analysis (FA), and R&D, are described in this…
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