Scienze della vita

Scienze della vita

Scienze della vita

Questo è il posto giusto per ampliare le vostre conoscenze, le capacità di ricerca e le applicazioni pratiche della microscopia in vari campi scientifici. Imparate come ottenere una visualizzazione precisa, l'interpretazione delle immagini e i progressi della ricerca. Troverete informazioni approfondite sulla microscopia avanzata, sulle tecniche di imaging, sulla preparazione dei campioni e sull'analisi delle immagini. Gli argomenti trattati comprendono la biologia cellulare, le neuroscienze e la ricerca sul cancro, con particolare attenzione alle applicazioni e alle innovazioni più avanzate.

Ricerca zebrafish

Per ottenere il miglior risultato nella visualizzazione, separazione, manipolazione e imaging è necessario riuscire a osservare i dettagli e le strutture, così da poter prendere la decisione giusta…
Ivesta 3 with integrated monitor.

Microscopi da dissezione

Ogni volta che devono essere eseguite delle dissezioni, possono essere necessarie molte ore di osservazione attraverso gli oculari di un microscopio da dissezione. Leica Microsystems ti offre una…
Area of a printed circuit board (PCB) which was imaged with extended depth of field (EDOF) using digital microscopy.

Depth of Field in Microscope Images

For microscopy imaging, depth of field is an important parameter when needing sharp images of sample areas with structures having significant changes in depth. In practice, depth of field is…
Image of magnetic steel taken with a 100x objective using Kerr microscopy. The magnetic domains in the grains appear in the image with lighter and darker patterns. A few domains are marked with red arrows. Courtesy of Florian Lang-Melzian, Robert Bosch GmbH, Germany.

Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy

The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
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