Precision 12" Inspection & Review System Leica DM12000 M

Precision 12" Inspection & Review System Leica DM12000 M

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Wafer

How to Boost your Microelectronic Component Inspection Performance

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…

Fields of Application

Semiconductor Wafer Processing, IC Packaging & Testing

Leica Microsystems’ customized, modular imaging solutions help suppliers and device manufacturers achieve fast and precise inspection and analysis for wafer processing, IC packaging, IC assembly, and…
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