Leica EM RES102 Ion Beam Milling Sample Preparation for Electron Microscopy Products Home Leica Microsystems
Leica EM RES102
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Sample Holder for the cleaning, polishing and contrast enhancement of SEM and LM samples at environment temperature or with LN2 cooling. The SEM holder allows to prepare a sample size up to 25mm…
Slope Cutter Holder for the production of cross-sectional (90°) and angled sections (35°) for SEM investigation of vertical structures sample. Specimens can be prepared at environment temperature or…
SEM clamp holder to hold small samples with maximum dimensions of 5 (H) x 7 (W) x 2 (D) mm. This holder can be easily transferred directly to the SEM without removing the sample.
Cooling Holder for the preparation of temperature-sensitive samples in combination with the LN2 cooling device.