James M. Marr , Ph.D.
James joined Leica Microsystems as an advanced workflow specialist covering Leica’s widefield product line in 2019. During his time at the National Institute of Standards and Technology (NIST), James leveraged advanced microscopy to develop and employ robust applications including: automated particle identification and extraction, widefield lifetime measurements, and super-resolution single-molecule imaging.
Studying Wound Healing of Smooth Muscle Cells
This article discusses how wound healing of cultured smooth muscle cells (SMCs) in multiwell plates can be reliably studied over time with less effort using a specially configured Leica inverted…
The Power of Pairing Adaptive Deconvolution with Computational Clearing
Learn how deconvolution allows you to overcome losses in image resolution and contrast in widefield fluorescence microscopy due to the wave nature of light and the diffraction of light by optical…
An Introduction to Computational Clearing
Many software packages include background subtraction algorithms to enhance the contrast of features in the image by reducing background noise. The most common methods used to remove background noise…